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Other articles related with "high resolution x-ay diffraction"：
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47801 |
Qing-Jun Xu(徐庆君), Bin Liu(刘斌), Shi-Ying Zhang(张士英), Tao Tao(陶涛), Zi-Li Xie(谢自力), Xiang-Qian Xiu(修向前), Dun-Jun Chen(陈敦军), Peng Chen(陈鹏), Ping Han(韩平), Rong Zhang(张荣), You-Dou Zheng(郑有炓) |
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Structural characterization of Al0.55Ga0.45N epitaxial layer determined by high resolution x-ray diffraction and transmission electron microscopy |
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Chin. Phys. B
2017 Vol.26 (4): 47801-047801
[Abstract]
(563)
[HTML 1 KB]
[PDF 590 KB]
(397)
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