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Other articles related with "electronic defects":
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47304 |
Dahai Li(李大海), Xiongfei Song(宋雄飞), Linfeng Hu(胡林峰), Ziyi Wang(王子仪), Rongjun Zhang(张荣君), Liangyao Chen(陈良尧), David Wei Zhang(张卫), Peng Zhou(周鹏) |
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Study on electrical defects level in single layer two-dimensional Ta2O5 |
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Chin. Phys. B
2016 Vol.25 (4): 47304-047304
[Abstract]
(806)
[HTML 1 KB]
[PDF 882 KB]
(324)
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