|
|
Other articles related with "early electrical reliability"：
|
|
17304 |
Ling Yang(杨凌), Xiao-Wei Zhou(周小伟), Xiao-Hua Ma(马晓华), Ling Lv(吕玲), Yan-Rong Cao(曹艳荣), Jin-Cheng Zhang(张进成), Yue Hao(郝跃) |
| |
|
Low power fluorine plasma effects on electrical reliability of AlGaN/GaN high electron mobility transistor |
| |
|
|
Chin. Phys. B
2017 Vol.26 (1): 17304-017304
[Abstract]
(723)
[HTML 1 KB]
[PDF 450 KB]
(476)
|
| First page | Previous Page | Next Page | Last Page | Page 1 of 1 |
|
|
