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Other articles related with "dual-active-layer structure":
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88503 |
Yu-Rong Liu(刘玉荣), Gao-Wei Zhao(赵高位), Pai-To Lai(黎沛涛), Ruo-He Yao(姚若河) |
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Improvement in the electrical performance and bias-stress stability of dual-active-layered silicon zinc oxide/zinc oxide thin-film transistor |
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Chin. Phys. B
2016 Vol.25 (8): 88503-088503
[Abstract]
(667)
[HTML 1 KB]
[PDF 1344 KB]
(557)
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