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Other articles related with "breakdown behavior":
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87308 |
Linna Zhao(赵琳娜), Peihong Yu(于沛洪), Zixiang Guo(郭子骧), Dawei Yan(闫大为), Hao Zhou(周浩), Jinbo Wu(吴锦波), Zhiqiang Cui(崔志强), Huarui Sun(孙华锐), Xiaofeng Gu(顾晓峰) |
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Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress |
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Chin. Phys. B
2017 Vol.26 (8): 87308-087308
[Abstract]
(763)
[HTML 1 KB]
[PDF 1376 KB]
(247)
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