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Jie Luo(罗捷), Tie-shan Wang(王铁山), Dong-qing Li(李东青), Tian-qi Liu(刘天奇), Ming-dong Hou(侯明东), You-mei Sun(孙友梅), Jing-lai Duan(段敬来), Hui-jun Yao(姚会军), Kai Xi(习凯), Bing Ye(叶兵), Jie Liu(刘杰) |
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Investigation of flux dependent sensitivity on single event effect in memory devices |
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Chin. Phys. B
2018 Vol.27 (7): 76101-076101
[Abstract]
(657)
[HTML 1 KB]
[PDF 1369 KB]
(219)
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