PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES |
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Fluid simulation of the pulsed bias effect on inductively coupled nitrogen discharges for low-voltage plasma immersion ion implantation |
Xiao-Yan Sun(孙晓艳), Yu-Ru Zhang(张钰如), Xue-Chun Li(李雪春), You-Nian Wang(王友年) |
Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams(Ministry of Education), School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024, China |
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Abstract Planar radio frequency inductively coupled plasmas (ICP) are employed for low-voltage ion implantation processes, with capacitive pulse biasing of the substrate for modulation of the ion energy. In this work, a two-dimensional (2D) self-consistent fluid model has been employed to investigate the influence of the pulsed bias power on the nitrogen plasmas for various bias voltages and pulse frequencies. The results indicate that the plasma density as well as the inductive power density increase significantly when the bias voltage varies from 0 V to -4000 V, due to the heating of the capacitive field caused by the bias power. The N+ fraction increases rapidly to a maximum at the beginning of the power-on time, and then it decreases and reaches the steady state at the end of the glow period. Moreover, it increases with the bias voltage during the power-on time, whereas the N2+ fraction exhibits a reverse behavior. When the pulse frequency increases to 25 kHz and 40 kHz, the plasma steady state cannot be obtained, and a rapid decrease of the ion density at the substrate surface at the beginning of the glow period is observed.
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Received: 23 July 2016
Revised: 01 September 2016
Accepted manuscript online:
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PACS:
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52.30.Ex
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(Two-fluid and multi-fluid plasmas)
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52.65.-y
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(Plasma simulation)
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52.50.Qt
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(Plasma heating by radio-frequency fields; ICR, ICP, helicons)
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Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 11175034, 11335004, and 11405019) and the Important National Science and Technology Specific Project of China (Grant No. 2011 ZX 02403-001). |
Corresponding Authors:
You-Nian Wang
E-mail: ynwang@dlut.edu.cn
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Cite this article:
Xiao-Yan Sun(孙晓艳), Yu-Ru Zhang(张钰如), Xue-Chun Li(李雪春), You-Nian Wang(王友年) Fluid simulation of the pulsed bias effect on inductively coupled nitrogen discharges for low-voltage plasma immersion ion implantation 2017 Chin. Phys. B 26 015201
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