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Abstract Abstract
Copper sulfide thin films were deposited onto different substrates at room temperature using thermal evaporation technique. X-ray diffraction spectra showed that the ?lm has an orthorhombic chalcocite (γ-Cu2S) phase. AFM images indicated that the film exhibits nanoparticles of size nearly 44 nm. Specrtophotometric measurements for the transmittance and reflectance were carried out at normal incidence in the spectral wavelength range 450-2500 nm. The refractive index, n, as well as the absorption index, k, was calculated. Some dispersion parameters were determined. The analysis of the ε1 and ε2 reveals several absorption peaks. The analysis of the spectral behavior of the absorption coefficient, α, in the absorption region revealed both of direct and indirect allowed transitions. Measurements of the dark electrical resistivity are studied as a function of film thickness and temperature. Tellier′s model is adopted for determination of mean free path and bulk resistance.
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Received: 23 June 2013
Published: 31 October 2013
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Cite this article:
. Optical and electrical characterizations of nanoparticles Cu2S thin films. Chin. Phys. B, , (): 0.
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