Properties of a dielectric plate using entangled two-photon states

doi:10.1088/1674-1056/21/9/094204

Abstract We theoretically study the properties of a dielectric plate with a modified Hong-Ou-Mandel interferometer. The fourth-order correlation functions are calculated in two regimes divided depending on the relative size between the thickness of dielectric plate and one-photon coherence length. When the thickness of dielectric plate is less than the one-photon coherence length, a novel modulation behavior of the coincidence rate is observed, which has not been discussed before. If the thickness of dielectric plate is larger than the one-photon coherence length, the coalescence and anti-coalescence are observed. The results obtained highlight the effects of linear optical element on the fourth-order interference.

Keywords: entangled two-photon states dielectric plate coherence length

Received: 28 November 2011
Revised: 28 February 2012
Accepted manuscript online:

PACS:	42.50.Dv	(Quantum state engineering and measurements)
	42.65.Lm	(Parametric down conversion and production of entangled photons)

Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 10874171 and 11174271), the National Fundamental Research Program of China (Grant No. 2011CB00200), the Innovation Fund from Chinese Academy of Sciences, and the Program for New Century Excellent Talents in University of China (Grant No. NCET-07-0791).

Corresponding Authors: Shi Bao-Sen
E-mail: drshi@ustc.edu.cn

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Zhou Zhi-Yuan (周志远), Ding Dong-Sheng (丁冬生), Shi Bao-Sen (史保森), Zou Xu-Bo (邹旭波), Guo Guang-Can (郭光灿) Properties of a dielectric plate using entangled two-photon states 2012 Chin. Phys. B 21 094204

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