中国物理B ›› 2002, Vol. 11 ›› Issue (4): 393-398.doi: 10.1088/1009-1963/11/4/315

• • 上一篇    

Twin-layer films of copper phthalocyanine and amorphous titanyl or vanadyl phthalocyanine

沈铁汉1, 长泽忠2, 村上健司2, 沈电洪3   

  1. (1)Joule Physics Laboratory, Institute for Materials Research, University of Salford, Maxwell Building, Salford, Greater Manchester M5 4WT, UK; (2)Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432-8001, Japan; (3)State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
  • 收稿日期:2001-08-31 出版日期:2002-04-13 发布日期:2005-06-13

Twin-layer films of copper phthalocyanine and amorphous titanyl or vanadyl phthalocyanine - an x-ray photoelectron spectroscopic study

Shen Dian-Hong (沈电洪)a, Shen Tie-Han (沈铁汉)b, T. Nagasawa (长泽忠)c, K. Murakami (村上健司)c    

  1. a State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China; b Joule Physics Laboratory, Institute for Materials Research, University of Salford, Maxwell Building, Salford, Greater Manchester M5 4WT, UK; c Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Hamamatsu 432-8001, Japan
  • Received:2001-08-31 Online:2002-04-13 Published:2005-06-13

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摘要： Metallophthalocyanine (MPc) twin-layer thin films on glass substrates, consisting of copper phthalocyanine (CuPc) overlayer and amorphous vanadyl phthalocyanine (VOPc) as well as titanyl phthalocyanine (TiOPc) buffers, were found to have different gas sensing characteristics. These twin-layer thin films were studied using x-ray photoemission spectroscopy. Photoelectrons of either V or Ti core levels were found to be present at the surface, indicating the existence of possible molecular migrations. The stability of the twin-layers under thermal annealing up to a maximum temperature of 250℃ and low-energy Ar ion bombardment was also examined and compared with that of CuPc directly grown on the substrates. We concluded that the twin-layer structures were thermally fairly stable. Ar ion bombardment, however, caused substantial damage to the Pc ligands and a reduction of the valence state of the central Cu atoms.

Abstract: Metallophthalocyanine (MPc) twin-layer thin films on glass substrates, consisting of copper phthalocyanine (CuPc) overlayer and amorphous vanadyl phthalocyanine (VOPc) as well as titanyl phthalocyanine (TiOPc) buffers, were found to have different gas sensing characteristics. These twin-layer thin films were studied using x-ray photoemission spectroscopy. Photoelectrons of either V or Ti core levels were found to be present at the surface, indicating the existence of possible molecular migrations. The stability of the twin-layers under thermal annealing up to a maximum temperature of 250℃ and low-energy Ar ion bombardment was also examined and compared with that of CuPc directly grown on the substrates. We concluded that the twin-layer structures were thermally fairly stable. Ar ion bombardment, however, caused substantial damage to the Pc ligands and a reduction of the valence state of the central Cu atoms.

Key words: phthalocyanine, x-ray photoemission spectra, annealing, Ar+ bombardment

中图分类号:  (Thin film structure and morphology)

  • 68.55.-a
81.40.Ef (Cold working, work hardening; annealing, post-deformation annealing, quenching, tempering recovery, and crystallization) 79.60.Dp (Adsorbed layers and thin films)