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Chin. Phys. B, 2013, Vol. 22(5): 057402    DOI: 10.1088/1674-1056/22/5/057402
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Energy gap suppression and excess current in Tl2Ba2CaCu2O8 intrinsic Josephson junctions

Wang Pei (王培), Xie Wei (解伟), Hu Lei (胡磊), Liu Xin (刘欣), Zhao Xin-Jie (赵新杰), He Ming (何明), Ji Lu (季鲁), Zhang Xu (张旭), Yan Shao-Lin (阎少林)
Department of Electronics, Nankai University, Tianjin 300071, China
Abstract  Intrinsic Josephson junctions in misaligned Tl2Ba2CaCu2O8 thin film were fabricated on LaAlO3 substrate. The temperature dependence of the critical current is investigated around liquid nitrogen temperature. In the current voltage characteristic, large voltage jump and free of resistive branch are observed, which shows good consistency with the intrinsic Josephson junctions. By analyzing the large gap voltage in the curve, great suppression of the energy gap is found. Through discussing the temperature dependence of the gap voltage in liquid nitrogen temperature, it is showed that this phenomenon can be caused by the nonequilibrium quasiparticle injection. The temperature influence on the excess current also confirms the nonequlibrium effect.
Keywords:  intrinsic Josephson junctions      current voltage characteristics      energy gap      excess current  
Received:  27 November 2012      Revised:  21 December 2012      Accepted manuscript online: 
PACS:  74.72.-h (Cuprate superconductors)  
  74.50.+r (Tunneling phenomena; Josephson effects)  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 61176119, 61171028, 51002081, and 61101018) and the Fundamental Research Funds for the Central Universities of China.
Corresponding Authors:  He Ming     E-mail:  heming@nankai.edu.cn

Cite this article: 

Wang Pei (王培), Xie Wei (解伟), Hu Lei (胡磊), Liu Xin (刘欣), Zhao Xin-Jie (赵新杰), He Ming (何明), Ji Lu (季鲁), Zhang Xu (张旭), Yan Shao-Lin (阎少林) Energy gap suppression and excess current in Tl2Ba2CaCu2O8 intrinsic Josephson junctions 2013 Chin. Phys. B 22 057402

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