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Chin. Phys. B, 2011, Vol. 20(8): 087202    DOI: 10.1088/1674-1056/20/8/087202
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Noise analysis and measurement of time delay and integration charge coupled device

Zhang Taoa, Wang De-Jiangb
a Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; b Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; Graduate School of the Chinese Academy of Sciences, Beijing 100049, China
Abstract  Time delay and integration (TDI) charge coupled device (CCD) noise sets a fundamental limit on image sensor performance, especially under low illumination in remote sensing applications. After introducing the complete sources of CCD noise, we study the effects of TDI operation mode on noise, and the relationship between different types of noise and number of the TDI stage. Then we propose a new technique to identify and measure sources of TDI CCD noise employing mathematical statistics theory, where theoretical analysis shows that noise estimated formulation converges well. Finally, we establish a testing platform to carry out experiments, and a standard TDI CCD is calibrated by using the proposed method. The experimental results show that the noise analysis and measurement methods presented in this paper are useful for modeling TDI CCDs.
Keywords:  noise measurement      remote sensing application      time delay and integration charge coupled device  
Received:  22 December 2010      Revised:  06 April 2011      Published:  15 August 2011
PACS:  72.70.+m (Noise processes and phenomena)  
Fund: Project supported by the National High Technology Research and Development Program of China (Grant No. 2006AA06A208).

Cite this article: 

Wang De-Jiang, Zhang Tao Noise analysis and measurement of time delay and integration charge coupled device 2011 Chin. Phys. B 20 087202

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