TOPICAL REVIEW—110th Anniversary of Lanzhou University |
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Techniques of microwave permeability characterization for thin films |
Xi-Ling Li(李喜玲)1,2,3, Jian-Bo Wang(王建波)1,2, Guo-Zhi Chai(柴国志)1,2 |
1 Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, China;
2 Key Laboratory for Special Function Materials and Structural Design of the Ministry of Education, Lanzhou University, Lanzhou 730000, China;
3 National Demonstration Center for Experimental Physics Education, Lanzhou University, Lanzhou 730000, China |
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Abstract We review the microwave methods to characterize the material properties, including the established and the emerging techniques in material characterization, especially the permeability spectra of the magnetic thin films. Almost all aspects of the microwave techniques for characterizing the permeability of thin films at microwave frequencies, including the new methods developed by our group, are presented. Firstly, the introduction part is presented. Secondly, the coaxial-line with transmission/reflection methods and the pickup coil with electromagnetic induction method are presented. Thirdly, the most widely used shorted microstrip technique is discussed in detail by the equivalent circuit method, transmission line method, and electromagnetic induction method. Fourthly, the coplanar waveguide method and the near-field probe method are also introduced. Finally, the high temperature permeability characterization by using the shorted microstrip line, the near-field microwave probe, and the shorted microstrip line probe are described in detail. This paper may be useful for researchers or engineers who will build up such measurement fixture to make full use of the existing methods or to develop original methods to meet the requirements for ever-rising measurements.
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Received: 10 June 2019
Revised: 05 August 2019
Accepted manuscript online:
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PACS:
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75.40.Gb
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(Dynamic properties?)
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84.40.Az
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(Waveguides, transmission lines, striplines)
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76.50.+g
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(Ferromagnetic, antiferromagnetic, and ferrimagnetic resonances; spin-wave resonance)
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Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 51871117, 51471080, and 51771086), the Fundamental Research Funds for the Central Universities of Lanzhou University, China (Grant No. lzujbky-2019-kb06), and the Basic Scientific Research Business Expenses of the Central University and Open Project of Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, China (Grant No. LZUMMM2019004). |
Corresponding Authors:
Guo-Zhi Chai
E-mail: chaigzh@lzu.edu.cn
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Cite this article:
Xi-Ling Li(李喜玲), Jian-Bo Wang(王建波), Guo-Zhi Chai(柴国志) Techniques of microwave permeability characterization for thin films 2019 Chin. Phys. B 28 097504
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Nicolson A M and Ross G F 1968 IEEE Trans. Instrum. Meas. 17 395
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[45] |
Hammerstad E D 1975 Eur. Microwave Conf. Proc. 268
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[46] |
Wheeler H A 1977 IEEE Trans. Microwave Theory Tech. 25 631
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[47] |
Grimes C A and Prodan J V 1993 J. Appl. Phys. 73 6989
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[48] |
Weir W W 1974 Proc. IEEE 62 33
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[49] |
Cagan V and Guyot M 1984 IEEE Trans. Magn. 20 1732
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[50] |
Grimes C A, Trouilloud P L and Walser R M 1988 IEEE Trans. Magn. 24 603
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[51] |
Bekker V, Seemann K and Leiste H 2004 J. Magn. Magn. Mater. 270 327
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[52] |
Jiang J, Du G, Yao Y, Liu C, Yuan L, Bie S, Zhang X and He H 2008 J. Magn. Magn. Mater. 320 750
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[53] |
Wu Y, Tang Z, Xu Y, Zhang B and He X 2010 IEEE Trans. Magn. 46 886
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[54] |
Steinhauer D E, Vlahacos C P, Wellstood F C, Anlage S M, Canedy C, Ramesh R, Stanishevsky A and Melngailis J 2000 Rev. Sci. Instrum. 71 2751
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[55] |
Gilbert T L 2004 IEEE Trans. Magn. 40 3443
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Kalarickal S S, Krivosik P, Wu M, Patton C E, chneider M L, Kabos P, Silva T J and Nibarger J P 2006 J. Appl. Phys. 99093909
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[57] |
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[58] |
Beguhn S, Zhou Z, R, S, Yang X, Lou J and Sun N X 2012 J. Appl. Phys. 111 07A503
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[59] |
Dutra R, Gonzalez-Chavez D E, Marcondes T L, Andrade A M H D, Geshev J and Sommer R L 2013 J. Magn. Magn. Mater. 346 1
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[60] |
He S and Panagopoulos C 2016 Rev. Sci. Instrum. 87 043110
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[61] |
Lee S C, Vlahacos C P, Feenstra B J, Schwartz A, Steinhauer D E, Wellstood F C and Anlage S M 2000 Appl. Phys. Lett. 77 4404
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[62] |
Mircea D I and Clinton T W 2007 Appl. Phys. Lett. 90 142504
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[63] |
Knorr T G and Hoffman R W 1959 Phys. Rev. 113 1039
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[64] |
Chai G, Phuoc N N and Ong C K 2014 Appl. Phys. Express 7 063001
|
[65] |
Clinton T W, Benatmane N, Hohlfeld J and Girt E 2008 J. Appl. Phys. 103 07F546
|
[66] |
Wang Z, Kelly M A, Shen Z X, Shao L, Chu W K and Edwards H 2005 Appl. Phys. Lett. 86 153118
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[67] |
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[69] |
Ding Y, Klemmer T J and Crawford T M 2004 J. Appl. Phys. 96 2969
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[70] |
Kos A B, Silva T J and Kabos P 2002 Rev. Sci. Instrum. 73 3563
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[71] |
Spinelli A, Bryant B, Delgado F, Fernandez-Rossier J and Otte A F 2014 Nat. Mater. 13 782
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[72] |
Yamaguchi M, Yabukami S and Arai K I 1996 IEEE Trans. Magn. 32 4941
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[73] |
Kimura T, Yabukami S, Ozawa T, Miyazawa Y, Kenju H and Shimada Y 2014 J. Magn. Soc. Jpn. 38 87
|
[74] |
Gregory A, Hao L, Klein N, Gallop J, Mattevi C, Shaforost O, Lees K and Clarke B 2014 Physica E 56 431
|
[75] |
Dubourg S, Queste S and Acher O 2005 J. Appl. Phys. 97 10F903
|
[76] |
Counil G, Kim J V, Devolder T, Crozat P, Chappert C and Cebollada A 2005 J. Appl. Phys. 98 023901
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[77] |
Counil G, Kim J-V, Devolder T, Crozat P, Chappert C and Cebollada A 2005 J. Appl. Phys. 98023901
|
[78] |
Ledieu M, Schoenstein F, Gallou J H L, Valls O, Queste S, Duverger F and Acher O 2003 J. Appl. Phys. 93 7202
|
[79] |
Pain D, Ledieu M, Acher O, Adenot A L and Duverger F 1999 J. Appl. Phys. 85 5151
|
[80] |
Kimura T, Yabukami S, Ozawa T, Miyazawa Y, Kenju H and Shimada Y 2014 J. Magn. Soc. Jpn. 38 87
|
[81] |
Yamaguchi M, Acher O, Miyazawa Y, Arai K I and Ledieu M 2002 J. Magn. Magn. Mater. 242 970
|
[82] |
Kittel C 1948 Phys. Rev. 73 155
|
[83] |
Nistor C, Sun K, Wang Z, Wu M, Mathieu C and Hadley M 2009 Appl. Phys. Lett. 95 012504
|
[84] |
Soh W T, Peng B, Chai G and Ong C K 2014 Rev. Sci. Instrum. 85 026109
|
[85] |
Wang Z, Sun K, Tong W, Wu M, Liu M and Sun N X 2010 Phys. Rev. B 81 064402
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