Abstract A normalized two-dimensional band-limited Weierstrass fractal function is used for modelling the dielectric rough surface. An analytic solution of the scattered field is derived based on the Kirchhoff approximation. The variance of scattering intensity is presented to study the fractal characteristics through theoretical analysis and numerical calculations. The important conclusion is obtained that the diffracted envelope slopes of scattering pattern can be approximated as a slope of linear equation. This conclusion will be applicable for solving the inverse problem of reconstructing rough surface and remote sensing.
Received: 26 July 2007
Revised: 25 March 2008
Accepted manuscript online:
Fund: Project supported by the National
Natural Science Foundation of China (Grant No 60571058), Specialized
Research Fund for the Doctoral Program of
Higher Education, China (Grant No 20070701010).
Cite this article:
Ren Xin-Cheng(任新成) and Guo Li-Xin(郭立新) Fractal characteristics investigation on electromagnetic scattering from 2-D Weierstrass fractal dielectric rough surface 2008 Chin. Phys. B 17 2956
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