中国物理B ›› 2015, Vol. 24 ›› Issue (11): 118102-118102.doi: 10.1088/1674-1056/24/11/118102

• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇    下一篇

Growth and fabrication of semi-polar InGaN/GaN multi-quantum well light-emitting diodes on microstructured Si (001) substrates

陈龙a b, 裴嘉鼎b, 史达特b, 李成b, 张建明b, 俞文杰a, 狄增峰a, 王曦a   

  1. a State Key Laboratory of Functional Materials for Informatics, Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China;
    b Shanghai Simæra Incorporated, Shanghai 201800, China
  • 收稿日期:2015-05-06 修回日期:2015-07-04 出版日期:2015-11-05 发布日期:2015-11-05
  • 通讯作者: Chen Long E-mail:long@simaera.com

Growth and fabrication of semi-polar InGaN/GaN multi-quantum well light-emitting diodes on microstructured Si (001) substrates

Chen Long (陈龙)a b, Payne Justin (裴嘉鼎)b, Strate Jan (史达特)b, Li Cheng (李成)b, Zhang Jian-Ming (张建明)b, Yu Wen-Jie (俞文杰)a, Di Zeng-Feng (狄增峰)a, Wang Xi (王曦)a   

  1. a State Key Laboratory of Functional Materials for Informatics, Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China;
    b Shanghai Simæra Incorporated, Shanghai 201800, China
  • Received:2015-05-06 Revised:2015-07-04 Online:2015-11-05 Published:2015-11-05
  • Contact: Chen Long E-mail:long@simaera.com

摘要: Semi-polar (1-101) InGaN/GaN light-emitting diodes were prepared on standard electronic-grade Si (100) substrates. Micro-stripes of GaN and InGaN/GaN quantum wells on semi-polar facets were grown on intersecting 111 planes of microscale V-grooved Si in metal-organic vapor phase epitaxy, covering over 50% of the wafer surface area. In-situ optical reflectivity and curvature measurements demonstrate that the effect of the thermal expansion coefficient mismatch was greatly reduced. A cross-sectional analysis reveals low threading dislocation density on the top of most surfaces. On such prepared (1-101) GaN, an InGaN/GaN LED was fabricated. Electroluminescence over 5 mA to 60 mA is found with a much lower blue-shift than that on the c-plane device. Such structures therefore could allow higher efficiency light emitters with a weak quantum confined Stark effect throughout the visible spectrum.

关键词: metalorganic chemical vapor deposition, semipolar, light emitting diodes

Abstract: Semi-polar (1-101) InGaN/GaN light-emitting diodes were prepared on standard electronic-grade Si (100) substrates. Micro-stripes of GaN and InGaN/GaN quantum wells on semi-polar facets were grown on intersecting 111 planes of microscale V-grooved Si in metal-organic vapor phase epitaxy, covering over 50% of the wafer surface area. In-situ optical reflectivity and curvature measurements demonstrate that the effect of the thermal expansion coefficient mismatch was greatly reduced. A cross-sectional analysis reveals low threading dislocation density on the top of most surfaces. On such prepared (1-101) GaN, an InGaN/GaN LED was fabricated. Electroluminescence over 5 mA to 60 mA is found with a much lower blue-shift than that on the c-plane device. Such structures therefore could allow higher efficiency light emitters with a weak quantum confined Stark effect throughout the visible spectrum.

Key words: metalorganic chemical vapor deposition, semipolar, light emitting diodes

中图分类号:  (III-V semiconductors)

  • 81.05.Ea
78.60.Fi (Electroluminescence)