[1] Özgürü, Alivov Y I, Liu C, Teke A, Reshchikov M A, Doğan S, Avrutin V, Cho S J and Morkoç H 2005 J. Appl. Phys. 98 041301 [2] Wang K, Li L and Yao S D 2009 Chin. Phys. Lett. 26 108101 [3] Etacheri V, Roshan R and Kumar V 2012 ACS Applied Materials & Interfaces 4 2717 [4] Vashaei Z, Minegishi T, Suzuki H, Hanada T, Cho M W, Yao T and Setiawan A 2005 J. Appl. Phys. 98 054911 [5] Maity S and Sahu P P 2019 Thin Solid Films 674 107 [6] Wang L K, Ju Z G, Shan C X, Zheng J, Li B H, Zhang Z Z, Yao B, Zhao D X, Shen D Z and Zhang J Y 2010 Journal of Crystal Growth 312 875 [7] Han S, Shen D Z, Zhang J Y, Zhao Y M, Jiang D Y, Ju Z G, Zhao D X and Yao B 2010 Vacuum 84 1149 [8] Xu T N, W H Z, Qiu D J and Chen N B 2003 Chin. Phys. Lett. 20 1829 [9] Takeuchi I, Yang W, Chang K S, Aronova M A, Venkatesan T, Vispute R D and Bendersky L A 2003 J. Appl. Phys. 94 7336 [10] Wei M, Boutwell R C, Mares J W, Scheurer A and Schoenfeld W V 2011 Appl. Phys. Lett. 98 261913 [11] Yadav M K, Ghosh M, Biswas R, Raychaudhuri A K, Mookerjee A and Datta S 2007 Phys. Rev. B 76 195450 [12] Wu K P, Qi J, Peng B, Tang K, Ye J D, Zhu S M and Gu S L 2015 Acta Phys. Sin. 64 187304 (in Chinese) [13] Liang J, Wu H Z, Lao Y F, Qiu D J, Chen N B and Xu T N 2004 Chin. Phys. Lett. 21 1135 [14] Boutwell R C, Wei M, Baudelet M and Schoenfeld W V 2014 J. Alloys Compd. 584 327 [15] Wu Y, Dong B, Zhang L, Song H B and Yan C J 2018 International Journal of Hydrogen Energy 43 12627 [16] Santander-Syro A F, Copie O, Kondo T, Fortuna F, Pailhes S, Weht R, Qiu X G, Bertran F, Nicolaou A, Taleb-Ibrahimi A, Le Fevre P, Herranz G, Bibes M, Reyren N, Apertet Y, Lecoeur P, Barthelemy A and Rozenberg M J 2011 Nature 469 189 [17] Haeni J H, Irvin P, Chang W, Uecker R, Reiche P, Li Y L, Choudhury S, Tian W, Hawley M E, Craigo B, Tagantsev A K, Pan X Q, Streiffer S K, Chen L Q, Kirchoefer S W, Levy J and Schlom D G 2004 Nature 430 758 [18] Zhang S G, Guo D L, Wang M J, Javed M S and Hu C G 2015 Applied Surface Science 335 115 [19] Ueno K, Nakamura S, Shimotani H, Ohtomo A, Kimura N, Nojima T, Aoki H, Iwasa Y and Kawasaki M 2008 Nat. Mater. 7 855 [20] Park M H, Lee H J, Kim G H, Kim Y J, Kim J H, Lee J H and Hwang C S 2011 Adv. Funct. Mater. 21 4305 [21] Zhu Y M, Chang W S, Yu R, Liu R R, Wei T C, He J H, Chu Y H and Zhan Q 2015 Appl. Phys. Lett. 107 191902 [22] Liang D D, Li X P, Wang J S, Wu L C and Chen P 2018 Solid-State Electronics 145 46 [23] Fritsch D, Schmidt H and Grundmann M 2006 Appl. Phys. Lett. 88 134104 [24] Pintilie I, Pasuk I, Ibanescu G A, Negrea R, Chirila C, Vasile E and Pintilie L 2012 J. Appl. Phys. 112 104103 [25] Zheng P P, Sun B, Chen Y Z, Elshekh H, Yu T, Mao S S, Zhu S H, Wang H Y, Zhao Y and Yu Z 2019 Applied Materials Today 14 21 [26] Zheng H, Zhu H, Tang Z, Wang Y, Wei H and Shan C 2020 Chin. Phys. B 29 097302 [27] Hu Z F, W H H, Lv Y W and Zhang X Q 2015 Chin. Phys. B 24 107302 [28] Zhou H, Wang J, Mai M F, Ma X Z, Hu S J, Xu M C, Bai L H and Yan S S 2020 Thin Solid Films 709 138074 [29] Maria J P, Trolier-McKinstry S, Schlom D G, Hawley M E and Brown G W 1998 J. Appl. Phys. 83 4373 |