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张先乐, 常鹏鹰, 杜刚, 刘晓彦. Role of remote Coulomb scattering on the hole mobility at cryogenic temperatures in SOI p-MOSFETs[J]. 中国物理B, 2020, 29(3): 38505-038505. |
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刘新宇, 郝继龙, 尤楠楠, 白云, 汤益丹, 杨成樾, 王盛凯. High-mobility SiC MOSFET with low density of interface traps using high pressure microwave plasma oxidation[J]. 中国物理B, 2020, 29(3): 37301-037301. |