中国物理B ›› 2014, Vol. 23 ›› Issue (4): 47301-047301.doi: 10.1088/1674-1056/23/4/047301

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

Direct measurement of the interfacial barrier height of the manganite p-n heterojunction

王妹, 王登京, 汪汝武, 李云宝   

  1. Department of Applied Physics, Wuhan University of Science and Technology, Wuhan 430081, China
  • 收稿日期:2013-07-25 修回日期:2013-10-17 出版日期:2014-04-15 发布日期:2014-04-15
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 10804089).

Direct measurement of the interfacial barrier height of the manganite p-n heterojunction

Wang Mei (王妹), Wang Deng-Jing (王登京), Wang Ru-Wu (汪汝武), Li Yun-Bao (李云宝)   

  1. Department of Applied Physics, Wuhan University of Science and Technology, Wuhan 430081, China
  • Received:2013-07-25 Revised:2013-10-17 Online:2014-04-15 Published:2014-04-15
  • Contact: Wang Deng-Jing E-mail:d.j.wang@163.com
  • About author:73.40.Lq; 73.40.Ei; 75.47.Gk
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 10804089).

摘要: A manganite p-n heterojunction composed of La0.67Sr0.33MnO3 film and 0.05 wt% Nb-doped SrTiO3 substrate is fabricated. Rectifying behavior of the junction well described by the Shockley equation is observed, and the transport properties of the interface are experimentally studied. A satisfactorily logarithmic linear dependence of resistance on temperature is observed in a temperature range of 150 K-380 K, and the linear relation between bias and activation energies deduced from the R-1/T curves is observed. According to activation energy, the interfacial barrier of the heterojunction is obtained, which is 0.91 eV.

关键词: manganite, heterojunction, interfacial barrier

Abstract: A manganite p-n heterojunction composed of La0.67Sr0.33MnO3 film and 0.05 wt% Nb-doped SrTiO3 substrate is fabricated. Rectifying behavior of the junction well described by the Shockley equation is observed, and the transport properties of the interface are experimentally studied. A satisfactorily logarithmic linear dependence of resistance on temperature is observed in a temperature range of 150 K-380 K, and the linear relation between bias and activation energies deduced from the R-1/T curves is observed. According to activation energy, the interfacial barrier of the heterojunction is obtained, which is 0.91 eV.

Key words: manganite, heterojunction, interfacial barrier

中图分类号:  (Other semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions)

  • 73.40.Lq
73.40.Ei (Rectification) 75.47.Gk (Colossal magnetoresistance)