Synergistic effects of neutron and gamma ray irradiation of commercial CHMOS microcontroller

doi:10.1088/1674-1056/19/6/066104

中国物理B ›› 2010, Vol. 19 ›› Issue (6): 66104-066104.doi: 10.1088/1674-1056/19/6/066104

Synergistic effects of neutron and gamma ray irradiation of commercial CHMOS microcontroller

金晓明¹, 范如玉², 陈伟³, 林东生³, 杨善潮³, 白小燕³, 刘岩³, 郭晓强³, 王桂珍³

(1)Department of Engineering Physics, Tsinghua University, Beijing 100084, China; (2)Department of Engineering Physics, Tsinghua University, Beijing 100084, China;Northwest Institute of Nuclear Technology, Xi'an 710024, China; (3)Northwest Institute of Nuclear Technology, Xi'an 710024, China

收稿日期:2009-08-08 出版日期:2010-06-15 发布日期:2010-06-15

Synergistic effects of neutron and gamma ray irradiation of commercial CHMOS microcontroller

Jin Xiao-Ming(金晓明)^a)^†, Fan Ru-Yu(范如玉)^a)b), Chen Wei(陈伟)^b),Lin Dong-Sheng(林东生)^b), Yang Shan-Chao(杨善潮)^b), Bai Xiao-Yan(白小燕)^b), Liu Yan(刘岩)^b),Guo Xiao-Qiang(郭晓强)^b), and Wang Gui-Zhen(王桂珍)^b)

^a Department of Engineering Physics, Tsinghua University, Beijing 100084, China; ^b Northwest Institute of Nuclear Technology, Xi'an 710024, China

Received:2009-08-08 Online:2010-06-15 Published:2010-06-15

摘要/Abstract

摘要： This paper presents the experimental results of a combined irradiation environment of neutron and gamma rays on 80C196KC20, which is a 16-bit high performance member of the MCS96 microcontroller family. The electrical and functional tests were made in three irradiation environments: neutron, gamma rays, combined irradiation of neutron and gamma rays. The experimental results show that the neutron irradiation can affect the total ionizing dose behaviour. Compared with the single radiation environment, the microcontroller exhibits considerably more severe degradation in neutron and gamma ray synergistic irradiation. This phenomenon may cause a significant hardness assurance problem.

Abstract: This paper presents the experimental results of a combined irradiation environment of neutron and gamma rays on 80C196KC20, which is a 16-bit high performance member of the MCS96 microcontroller family. The electrical and functional tests were made in three irradiation environments: neutron, gamma rays, combined irradiation of neutron and gamma rays. The experimental results show that the neutron irradiation can affect the total ionizing dose behaviour. Compared with the single radiation environment, the microcontroller exhibits considerably more severe degradation in neutron and gamma ray synergistic irradiation. This phenomenon may cause a significant hardness assurance problem.

Key words: total ionizing dose, neutron irradiation, synergistic effect, microcontroller

中图分类号: (Pulse and digital circuits)

84.30.Sk

85.30.Tv (Field effect devices) 61.80.Hg (Neutron radiation effects) 61.80.Ed (γ-ray effects)

金晓明, 范如玉, 陈伟, 林东生, 杨善潮, 白小燕, 刘岩, 郭晓强, 王桂珍. Synergistic effects of neutron and gamma ray irradiation of commercial CHMOS microcontroller[J]. 中国物理B, 2010, 19(6): 66104-066104.

Jin Xiao-Ming(金晓明), Fan Ru-Yu(范如玉), Chen Wei(陈伟),Lin Dong-Sheng(林东生), Yang Shan-Chao(杨善潮), Bai Xiao-Yan(白小燕), Liu Yan(刘岩),Guo Xiao-Qiang(郭晓强), and Wang Gui-Zhen(王桂珍). Synergistic effects of neutron and gamma ray irradiation of commercial CHMOS microcontroller[J]. Chin. Phys. B, 2010, 19(6): 66104-066104.

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Synergistic effects of neutron and gamma ray irradiation of commercial CHMOS microcontroller

Synergistic effects of neutron and gamma ray irradiation of commercial CHMOS microcontroller

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