中国物理B ›› 2026, Vol. 35 ›› Issue (2): 27504-027504.doi: 10.1088/1674-1056/adf6a5

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Thickness dependence of the magnetic properties of barium ferrite films prepared by pulsed laser deposition

Chengbo Zhao(赵诚博)1, Bowei Han(韩博纬)1, Yuchen Zhao(赵宇辰)2, Yang Sun(孙洋)2, Lichen Wang(王利晨)3, Ruoshui Liu(刘若水)3, Yunzhong Chen(陈允忠)2, and Dengjing Wang(王登京)1,†   

  1. 1 Department of Applied Physics, Wuhan University of Science and Technology, Wuhan 430065, China;
    2 Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    3 CAS Key Laboratory of Magnetic Materials and Devices and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
  • 收稿日期:2025-04-27 修回日期:2025-07-20 接受日期:2025-08-01 发布日期:2026-01-27
  • 通讯作者: Dengjing Wang E-mail:wangdengjing@wust.edu.cn

Thickness dependence of the magnetic properties of barium ferrite films prepared by pulsed laser deposition

Chengbo Zhao(赵诚博)1, Bowei Han(韩博纬)1, Yuchen Zhao(赵宇辰)2, Yang Sun(孙洋)2, Lichen Wang(王利晨)3, Ruoshui Liu(刘若水)3, Yunzhong Chen(陈允忠)2, and Dengjing Wang(王登京)1,†   

  1. 1 Department of Applied Physics, Wuhan University of Science and Technology, Wuhan 430065, China;
    2 Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    3 CAS Key Laboratory of Magnetic Materials and Devices and Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
  • Received:2025-04-27 Revised:2025-07-20 Accepted:2025-08-01 Published:2026-01-27
  • Contact: Dengjing Wang E-mail:wangdengjing@wust.edu.cn

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摘要： BaFe$_{12}$O$_{19}$ (BaM) thin films with thicknesses ranging from 15 nm-200 nm were deposited on Al$_{2}$O$_{3}$(0001) substrates by pulsed laser deposition (PLD). X-ray diffraction patterns show that a buffer layer with a thickness of nearly 60 nm forms on the substrate, and then a $c$-axis perpendicularly oriented BaM thin film grows on the buffer layer. Atomic force microscopy results indicate that the BaM thin film exhibits a spiral island growth mode on the buffer layer. Magnetic hysteresis loop results confirm that the buffer layer exhibits no significant magnetic anisotropy, while the BaM thin film exhibits perpendicular magnetic anisotropy. The out-of-plane coercivity decreases with increasing BaM thin-film thickness due to the combined effect of grain size growth and lattice strain relaxation. The 200 nm thick film exhibits optimum magnetic properties with $M_{\rm s}=319 $ emu/cm$^{3}$ and $H_{\rm c}=1546 $ Oe.

关键词: pulsed laser deposition, barium hexaferrite film, self-made buffer layer, perpendicular magnetic anisotropy, film thickness

Abstract: BaFe$_{12}$O$_{19}$ (BaM) thin films with thicknesses ranging from 15 nm-200 nm were deposited on Al$_{2}$O$_{3}$(0001) substrates by pulsed laser deposition (PLD). X-ray diffraction patterns show that a buffer layer with a thickness of nearly 60 nm forms on the substrate, and then a $c$-axis perpendicularly oriented BaM thin film grows on the buffer layer. Atomic force microscopy results indicate that the BaM thin film exhibits a spiral island growth mode on the buffer layer. Magnetic hysteresis loop results confirm that the buffer layer exhibits no significant magnetic anisotropy, while the BaM thin film exhibits perpendicular magnetic anisotropy. The out-of-plane coercivity decreases with increasing BaM thin-film thickness due to the combined effect of grain size growth and lattice strain relaxation. The 200 nm thick film exhibits optimum magnetic properties with $M_{\rm s}=319 $ emu/cm$^{3}$ and $H_{\rm c}=1546 $ Oe.

Key words: pulsed laser deposition, barium hexaferrite film, self-made buffer layer, perpendicular magnetic anisotropy, film thickness

中图分类号:  (Magnetic properties of thin films, surfaces, and interfaces)

  • 75.70.-i
75.60.Ej (Magnetization curves, hysteresis, Barkhausen and related effects) 68.37.Ps (Atomic force microscopy (AFM)) 75.30.Gw (Magnetic anisotropy)