中国物理B ›› 2022, Vol. 31 ›› Issue (9): 99901-099901.doi: 10.1088/1674-1056/ac89d3

• • 上一篇    

Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”

Ming Xu(徐明)1,†, Tao Yang(杨涛)1, Wenxue Yu(于文学)2, Ning Yang(杨宁)3, Cuixiu Liu(刘翠秀)1, Zhenhong Mai(麦振洪)1, Wuyan Lai(赖武彦)1, and Kun Tao(陶琨)3   

  1. 1 Institute of Physics&Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080, China;
    2 Department of Materials Science, Jilin University, Changchun 130023, China;
    3 Department of Materials Science, Tsinghua University, Beijing 100083, China
  • 收稿日期:2022-08-02 接受日期:2022-08-16 出版日期:2022-08-19 发布日期:2022-09-03
  • 通讯作者: Ming Xu E-mail:hsuming_2001@aliyun.com

Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”

Ming Xu(徐明)1,†, Tao Yang(杨涛)1, Wenxue Yu(于文学)2, Ning Yang(杨宁)3, Cuixiu Liu(刘翠秀)1, Zhenhong Mai(麦振洪)1, Wuyan Lai(赖武彦)1, and Kun Tao(陶琨)3   

  1. 1 Institute of Physics&Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080, China;
    2 Department of Materials Science, Jilin University, Changchun 130023, China;
    3 Department of Materials Science, Tsinghua University, Beijing 100083, China
  • Received:2022-08-02 Accepted:2022-08-16 Online:2022-08-19 Published:2022-09-03
  • Contact: Ming Xu E-mail:hsuming_2001@aliyun.com

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摘要： Equation (6) in Chin. Phys. 09 0833 (2000) is corrected. All subsequent derivations were given based on the correct Eq. (6), so the conclusions in the paper are not affected by the errata.

关键词: erratum, film thickness, x-ray

Abstract: Equation (6) in Chin. Phys. 09 0833 (2000) is corrected. All subsequent derivations were given based on the correct Eq. (6), so the conclusions in the paper are not affected by the errata.

Key words: erratum, film thickness, x-ray

中图分类号:  (Errata)

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