中国物理B ›› 2022, Vol. 31 ›› Issue (4): 47901-047901.doi: 10.1088/1674-1056/ac322c
Tiancun Hu(胡天存)1,2, Shukai Zhu(朱淑凯)3, Yanan Zhao(赵亚楠)3,†, Xuan Sun(孙璇)3, Jing Yang(杨晶)2, Yun He(何鋆)2, Xinbo Wang(王新波)2, Chunjiang Bai(白春江)2, He Bai(白鹤)2, Huan Wei(魏焕)2, Meng Cao(曹猛)1, Zhongqiang Hu(胡忠强)3, Ming Liu(刘明)3, and Wanzhao Cui(崔万照)2,‡
Tiancun Hu(胡天存)1,2, Shukai Zhu(朱淑凯)3, Yanan Zhao(赵亚楠)3,†, Xuan Sun(孙璇)3, Jing Yang(杨晶)2, Yun He(何鋆)2, Xinbo Wang(王新波)2, Chunjiang Bai(白春江)2, He Bai(白鹤)2, Huan Wei(魏焕)2, Meng Cao(曹猛)1, Zhongqiang Hu(胡忠强)3, Ming Liu(刘明)3, and Wanzhao Cui(崔万照)2,‡
摘要: Reducing the secondary electron yield (SEY) of Ag-plated aluminum alloy is important for high-power microwave components. In this work, Cu doped carbon films are prepared and the secondary electron emission characteristics are studied systematically. The secondary electron coefficient δmax of carbon films increases with the Cu contents increasing at first, and then decreases to 1.53 at a high doping ratio of 0.645. From the viewpoint of surface structure, the higher the content of Cu is, the rougher the surface is, since more cluster particles appear on the surface due to the small solid solubility of Cu in the amorphous carbon network. However, from viewpoint of the electronic structure, the reduction of the sp2 hybrid bonds will increase the SEY effect as the content of Cu increases, due to the decreasing probability of collision with free electrons. Thus, the two mechanisms would compete and coexist to affect the SEY characteristics in Cu doped carbon films.
中图分类号: (Electron impact: secondary emission)