Measurement of inner surface roughness of capillary by an x-ray reflectivity method

doi:10.1088/1674-1056/20/4/040702

中国物理B ›› 2011, Vol. 20 ›› Issue (4): 40702-040702.doi: 10.1088/1674-1056/20/4/040702

Measurement of inner surface roughness of capillary by an x-ray reflectivity method

李玉德, 林晓燕, 谭植元, 孙天希, 刘志国

The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China

收稿日期:2010-12-31 修回日期:2011-01-04 出版日期:2011-04-15 发布日期:2011-04-15
基金资助:
Project supported by the Natural Science Foundation of Beijing, China (Grant No. 1102019) and the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20100003120010).

Measurement of inner surface roughness of capillary by an x-ray reflectivity method

Li Yu-De(李玉德)^†,Lin Xiao-Yan(林晓燕),Tan Zhi-Yuan(谭植元), Sun Tian-Xi(孙天希),and Liu Zhi-Guo(刘志国)

The Key Laboratory of Beam Technology and Material Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing Radiation Center, Beijing 100875, China

Received:2010-12-31 Revised:2011-01-04 Online:2011-04-15 Published:2011-04-15
Supported by:
Project supported by the Natural Science Foundation of Beijing, China (Grant No. 1102019) and the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20100003120010).

摘要/Abstract

摘要： The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope (AFM). The roughness measured by this new method can reach the order of angstroms with high quality capillaries.

Abstract: The inner surface roughness of a capillary is investigated by the reflectivity of x-rays penetrating through the capillary. The results are consistent with the data from atomic force microscope (AFM). The roughness measured by this new method can reach the order of angstroms with high quality capillaries.

Key words: inner surface roughness, reflectivity method, capillary

中图分类号: (X- and γ-ray instruments)

07.85.-m

李玉德, 林晓燕, 谭植元, 孙天希, 刘志国. Measurement of inner surface roughness of capillary by an x-ray reflectivity method[J]. 中国物理B, 2011, 20(4): 40702-040702.

Li Yu-De(李玉德),Lin Xiao-Yan(林晓燕),Tan Zhi-Yuan(谭植元), Sun Tian-Xi(孙天希),and Liu Zhi-Guo(刘志国) . Measurement of inner surface roughness of capillary by an x-ray reflectivity method[J]. Chin. Phys. B, 2011, 20(4): 40702-040702.

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Measurement of inner surface roughness of capillary by an x-ray reflectivity method

Measurement of inner surface roughness of capillary by an x-ray reflectivity method

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