中国物理B ›› 1998, Vol. 7 ›› Issue (4): 292-307.doi: 10.1088/1004-423X/7/4/008
• • 上一篇
宋志棠, 任巍, 张良莹, 姚熹
SONG ZHI-TANG (宋志棠), REN WEI (任巍), ZHANG LIANG-YING (张良莹), YAO XI (姚熹)
摘要: Pinning effect of lead lanthanum titanate (PLT) ferroelectric thin films with excess PbO of 20 mol% has been studied for deposition on diffe rent substrates. Silicon, sapphire and quartz were used as substrates on which P t/Ti or LaNiO3 thin films were deposited as bottom electrodes. Electron probe analysis results showed that there was still a certain amount of excess Pb in PLT films after annealing at 550 ℃ for 1 h, and the amount of it was dependent on the substrate used. The distribution of excess Pb in the films was investig ated by Auger electron spectroscopy depth profile. It was shown that the substrates and the bottom electrodes had significant effects on the content and distrib ution of excess Pb in PLT films. The excess Pb and its accumulation at the inter face between the film and bottom electrode may act as pinning centers and have a pinning effect on domains, which can be observed by abnormal P-E hysteresis loops and abnormal C-V curves. The excess Pb content in the films and the accumulation of Pb at the interface were high in PLT films deposited on Pt/Ti/S i, and considerable pinning effect was observed. As LaNiO3 would absorb most part of the excess Pb in PLT films, the content of excess Pb in the films deposited on LaNiO3/Si was very low and the pinning effect was hardly observed.
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