Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy

doi:10.1088/1674-1056/abad1e

中国物理B ›› 2020, Vol. 29 ›› Issue (10): 106103-.doi: 10.1088/1674-1056/abad1e

Li-Jun Xu(徐丽君)¹^,², Peng-Fei Zhai(翟鹏飞)¹^,²^,†(), Sheng-Xia Zhang(张胜霞)¹, Jian Zeng(曾健)¹^,², Pei-Pei Hu(胡培培)¹, Zong-Zhen Li(李宗臻)¹^,², Li Liu(刘丽)¹^,², You-Mei Sun(孙友梅)¹^,², Jie Liu(刘杰)¹^,²^,‡()

收稿日期:2020-04-27 修回日期:2020-08-06 接受日期:2020-08-07 出版日期:2020-10-05 发布日期:2020-10-05
通讯作者: Peng-Fei Zhai(翟鹏飞), Jie Liu(刘杰)

Characterization of swift heavy ion tracks in MoS₂ by transmission electron microscopy

Li-Jun Xu(徐丽君)^1,2, Peng-Fei Zhai(翟鹏飞)^1,2,†, Sheng-Xia Zhang(张胜霞)¹, Jian Zeng(曾健)^1,2, Pei-Pei Hu(胡培培)¹, Zong-Zhen Li(李宗臻)^1,2, Li Liu(刘丽)^1,2, You-Mei Sun(孙友梅)^1,2, and Jie Liu(刘杰)^1,2,‡

¹ Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
² School of Nuclear Science and Technology, University of Chinese Academy of Sciences, Beijing 100049, China

Received:2020-04-27 Revised:2020-08-06 Accepted:2020-08-07 Online:2020-10-05 Published:2020-10-05
Contact: ^†Corresponding author. E-mail: zhaipengfei@impcas.ac.cn ^‡Corresponding author. E-mail: j.liu@impcas.ac.cn
About author:
†Corresponding author. E-mail: zhaipengfei@impcas.ac.cn
‡Corresponding author. E-mail: j.liu@impcas.ac.cn
* Project supported by the National Natural Science Foundation of China (Grant Nos. 11675233, 11690041, 11405229, 11705246, and 11505243), Chinese Academy of Sciences “Light of West China” Program, and the Youth Innovation Promotion Association of Chinese Academy of Sciences (Grant No. 2020412).

摘要/Abstract

Abstract:

The various morphologies of tracks in MoS₂ irradiated by swift heavy ions at normal and 30° incidence with 9.5–25.0 MeV/u ⁸⁶Kr, ¹²⁹Xe, ¹⁸¹Ta, and ²⁰⁹Bi ions were investigated by transmission electron microscopy. The diameter of ion tracks increases from 1.9 nm to 4.5 nm with increasing electronic energy loss. The energy loss threshold of the track formation in MoS₂ is predicted as about 9.7 keV/nm based on the thermal spike model and it seems consistent with the experimental results. It is shown that the morphology of ion tracks is related to the penetration length of ions in MoS₂. The formation process of ion tracks is discussed based on the cooperative process of outflow and recrystallization of the molten phase during rapid quenching.

Key words: ion track, MoS₂, transmission electron microscopy (TEM), recrystallization

中图分类号: (Physical radiation effects, radiation damage)

61.80.-x

61.82.-d (Radiation effects on specific materials) 68.37.Lp (Transmission electron microscopy (TEM))

Li-Jun Xu(徐丽君), Peng-Fei Zhai(翟鹏飞), Sheng-Xia Zhang(张胜霞), Jian Zeng(曾健), Pei-Pei Hu(胡培培), Zong-Zhen Li(李宗臻), Li Liu(刘丽), You-Mei Sun(孙友梅), Jie Liu(刘杰). [J]. 中国物理B, 2020, 29(10): 106103-.

Li-Jun Xu(徐丽君), Peng-Fei Zhai(翟鹏飞)†, Sheng-Xia Zhang(张胜霞), Jian Zeng(曾健), Pei-Pei Hu(胡培培), Zong-Zhen Li(李宗臻), Li Liu(刘丽), You-Mei Sun(孙友梅), and Jie Liu(刘杰)‡. Characterization of swift heavy ion tracks in MoS₂ by transmission electron microscopy[J]. Chin. Phys. B, 2020, 29(10): 106103-.

图/表 7

参考文献 43

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Ion	Energy/MeV	(dE / x)_e/(keV/nm)	(dE/dx)_n/(keV/nm)	Range/μm	Fluence/(ions/cm²)
⁸⁶Kr	2029.4	7.7	3.9×10⁻³	193.6	5×10¹⁰
⁸⁶Kr	1795.3	8.2	4.4×10⁻³	164.0	5×10¹⁰
⁸⁶Kr	1503.4	9.1	5.1×10⁻³	130.2	5×10¹⁰
¹²⁹Xe	2047.5	18.9	1.2×10⁻²	96.8	5×10¹²
¹⁸¹Ta	1785.7	28.8	3.2×10⁻²	65.8	5×10¹⁰
²⁰⁹Bi	1390.0	35.2	5.7×10⁻²	46.8	5×10¹¹

Morphology	L_ap/nm	L_ac/nm	D_h/nm
cylinders	30.5±1.0	35.2±1.2	4.0±0.2
sunglass	180.3±1.1	208.2±1.3	16.6±0.7
q-tips	187.4±1.4	216.4±1.6	20.6±1.1

Characterization of swift heavy ion tracks in MoS₂ by transmission electron microscopy

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