XPS and Raman studies of electron irradiated sodium silicate glass

doi:10.1088/1674-1056/22/12/126101

Chin. Phys. B ›› 2013, Vol. 22 ›› Issue (12): 126101-126101.doi: 10.1088/1674-1056/22/12/126101

• CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES • 上一篇下一篇

XPS and Raman studies of electron irradiated sodium silicate glass

陈亮, 王铁山, 张根发, 杨坤杰, 彭海波, 张利民

School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China

收稿日期:2013-01-03 修回日期:2013-05-31 出版日期:2013-10-25 发布日期:2013-10-25

XPS and Raman studies of electron irradiated sodium silicate glass

Chen Liang (陈亮), Wang Tie-Shan (王铁山), Zhang Gen-Fa (张根发), Yang Kun-Jie (杨坤杰), Peng Hai-Bo (彭海波), Zhang Li-Min (张利民)

School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China

Received:2013-01-03 Revised:2013-05-31 Online:2013-10-25 Published:2013-10-25
Contact: Wang Tie-Shan E-mail:tswang@lzu.edu.cn

摘要/Abstract

摘要： The microstructure modifications of sodium silicate glass induced by 1.2-MeV electron irradiation are studied by x-ray photoelectron spectroscopy and Raman spectroscopy. Depth profile analyses are also performed on the irradiated glass at 10⁹ Gy. A sodium-depleted layer with a thickness of a few tens of nanometers and the corresponding increase of network polymerization on the top surface are observed after electron bombardment, while the polymerization in the subsurface region has a negligible variation with the irradiation dose. Moreover, the formation of molecular oxygen after electron irradiation is evidenced, which is mainly aggregated in the first two-micron-thick irradiated glass surface. These modifications are correlated to the network relaxation process as a consequence of the diffusion and desorption of sodium species during electron irradiation.

关键词: silicate glass, electron irradiation, network polymerization, oxygen molecule

Abstract: The microstructure modifications of sodium silicate glass induced by 1.2-MeV electron irradiation are studied by x-ray photoelectron spectroscopy and Raman spectroscopy. Depth profile analyses are also performed on the irradiated glass at 10⁹ Gy. A sodium-depleted layer with a thickness of a few tens of nanometers and the corresponding increase of network polymerization on the top surface are observed after electron bombardment, while the polymerization in the subsurface region has a negligible variation with the irradiation dose. Moreover, the formation of molecular oxygen after electron irradiation is evidenced, which is mainly aggregated in the first two-micron-thick irradiated glass surface. These modifications are correlated to the network relaxation process as a consequence of the diffusion and desorption of sodium species during electron irradiation.

Key words: silicate glass, electron irradiation, network polymerization, oxygen molecule

中图分类号: (Glasses)

61.43.Fs

61.80.Fe (Electron and positron radiation effects)

陈亮, 王铁山, 张根发, 杨坤杰, 彭海波, 张利民. XPS and Raman studies of electron irradiated sodium silicate glass[J]. Chin. Phys. B, 2013, 22(12): 126101-126101.

Chen Liang (陈亮), Wang Tie-Shan (王铁山), Zhang Gen-Fa (张根发), Yang Kun-Jie (杨坤杰), Peng Hai-Bo (彭海波), Zhang Li-Min (张利民). XPS and Raman studies of electron irradiated sodium silicate glass[J]. Chin. Phys. B, 2013, 22(12): 126101-126101.

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XPS and Raman studies of electron irradiated sodium silicate glass

XPS and Raman studies of electron irradiated sodium silicate glass

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