中国物理B ›› 2023, Vol. 32 ›› Issue (4): 47303-047303.doi: 10.1088/1674-1056/acb421

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Conductive path and local oxygen-vacancy dynamics: Case study of crosshatched oxides

Z W Liang(梁正伟)1,2, P Wu(吴平)1, L C Wang(王利晨)2,4, B G Shen(沈保根)2,3,4,5, and Zhi-Hong Wang(王志宏)2,†   

  1. 1 Department of Physics, University of Science and Technology Beijing, Beijing 100083, China;
    2 Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    3 School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 101408, China;
    4 Ningbo Institute of Materials Technology&Engineering, Chinese Academy of Sciences, Ningbo 315201, China;
    5 Ganjiang Innovation Academy, Chinese Academy of Sciences, Ganzhou 341000, China
  • 收稿日期:2022-11-20 修回日期:2023-01-15 接受日期:2023-01-18 出版日期:2023-03-10 发布日期:2023-03-14
  • 通讯作者: Zhi-Hong Wang E-mail:z.wang@iphy.ac.cn
  • 基金资助:
    This work was funded by the Science Center of the National Science Foundation of China (Grant No. 52088101), the National Natural Science Foundation of China (Grant Nos. 11474342 and 11174353), the National Key Research and Development Program of China, and the Strategic Priority Research Program B of the Chinese Academy of Sciences. This work was also supported in part by the beamline 08U1A of SSRF.

Conductive path and local oxygen-vacancy dynamics: Case study of crosshatched oxides

Z W Liang(梁正伟)1,2, P Wu(吴平)1, L C Wang(王利晨)2,4, B G Shen(沈保根)2,3,4,5, and Zhi-Hong Wang(王志宏)2,†   

  1. 1 Department of Physics, University of Science and Technology Beijing, Beijing 100083, China;
    2 Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    3 School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 101408, China;
    4 Ningbo Institute of Materials Technology&Engineering, Chinese Academy of Sciences, Ningbo 315201, China;
    5 Ganjiang Innovation Academy, Chinese Academy of Sciences, Ganzhou 341000, China
  • Received:2022-11-20 Revised:2023-01-15 Accepted:2023-01-18 Online:2023-03-10 Published:2023-03-14
  • Contact: Zhi-Hong Wang E-mail:z.wang@iphy.ac.cn
  • Supported by:
    This work was funded by the Science Center of the National Science Foundation of China (Grant No. 52088101), the National Natural Science Foundation of China (Grant Nos. 11474342 and 11174353), the National Key Research and Development Program of China, and the Strategic Priority Research Program B of the Chinese Academy of Sciences. This work was also supported in part by the beamline 08U1A of SSRF.

摘要: By employing scanning probe microscopy, conductive path and local oxygen-vacancy dynamics have been investigated in crosshatched La0.7Sr0.3MnO3 thin films grown onto flat and vicinal LaAlO3(001) single crystal substrates. Consistent with prior studies, the crosshatch topography was observed first by dynamical force microscopy as the epi-stain started to release with increasing film thickness. Second, by using conductive atomic force microscopy (CAFM), conductive crosshatch and dots (locally aligned or random) were unravelled, however, not all of which necessarily coincided with that shown in the in situ atomic force microscopy. Furthermore, the current-voltage responses were probed by CAFM, revealing the occurrence of threshold and/or memristive switchings. Our results demonstrate that the resistive switching relies on the evolution of the local profile and concentration of oxygen vacancies, which, in the crosshatched films, are modulated by both the misfit and threading dislocations.

关键词: resistive switching, oxygen-vacancy dynamics, crosshatch, dislocation, scanning probe microscopy

Abstract: By employing scanning probe microscopy, conductive path and local oxygen-vacancy dynamics have been investigated in crosshatched La0.7Sr0.3MnO3 thin films grown onto flat and vicinal LaAlO3(001) single crystal substrates. Consistent with prior studies, the crosshatch topography was observed first by dynamical force microscopy as the epi-stain started to release with increasing film thickness. Second, by using conductive atomic force microscopy (CAFM), conductive crosshatch and dots (locally aligned or random) were unravelled, however, not all of which necessarily coincided with that shown in the in situ atomic force microscopy. Furthermore, the current-voltage responses were probed by CAFM, revealing the occurrence of threshold and/or memristive switchings. Our results demonstrate that the resistive switching relies on the evolution of the local profile and concentration of oxygen vacancies, which, in the crosshatched films, are modulated by both the misfit and threading dislocations.

Key words: resistive switching, oxygen-vacancy dynamics, crosshatch, dislocation, scanning probe microscopy

中图分类号:  (Electronic transport in nanoscale materials and structures)

  • 73.63.-b
68.37.-d (Microscopy of surfaces, interfaces, and thin films) 61.72.Yx (Interaction between different crystal defects; gettering effect) 72.80.-r (Conductivity of specific materials)