中国物理B ›› 2008, Vol. 17 ›› Issue (4): 1454-1460.doi: 10.1088/1674-1056/17/4/051

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Comparison between photoluminescence spectroscopy and photoreflectance spectroscopy in CuGaSe2 epilayer

甄国涌, 菅傲群, 徐宏妍, 薛晨阳, 张文栋   

  1. Key Laboratory of Instrumentation Science & Dynamic Measurement (North University of China), Ministry of Education and National Key Laboratory For Electronic Measurement Technology North University of China, Taiyuan 030051, China
  • 收稿日期:2007-07-10 修回日期:2007-10-18 出版日期:2008-04-20 发布日期:2008-04-20
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos 50405025 and 50535030) and the Program for New Century Excellent Talents in University.

Comparison between photoluminescence spectroscopy and photoreflectance spectroscopy in CuGaSe2 epilayer

Zhen Guo-Yong(甄国涌), Jian Ao-Qun(菅傲群), Xu Hong-Yan(徐宏妍),Xue Chen-Yang(薛晨阳)†, and Zhang Wen-Dong(张文栋)   

  1. Key Laboratory of Instrumentation Science & Dynamic Measurement (North University of China), Ministry of Education and National Key Laboratory For Electronic Measurement Technology North University of China, Taiyuan 030051, China
  • Received:2007-07-10 Revised:2007-10-18 Online:2008-04-20 Published:2008-04-20
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos 50405025 and 50535030) and the Program for New Century Excellent Talents in University.

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摘要： Photoluminescence (PL) spectroscopy and photoreflectance (PR) spectroscopy are very useful techniques for studying the properties of materials. In this paper, the same material of Cu-rich metal-organic vapour phase epitaxy (MOVPE) grown CuGaSe$_{2}$ layer is investigated in a temperature range from 20 to 300\,K to compare these two techniques. Both PL and PR spectra appear red shifted, less intense and broadened. The temperature dependence of interband transitions is studied by using the Manoogian--Leclerc equation. The values of the band gap energy at $T$=0\,K and the effective phonon temperature are estimated. The temperature dependences of intensities and broadenings of PL and PR spectral lines are also analysed. Based on the results of the comparison, the features and applications of the PL and PR can be shown in detail.

关键词: photoluminescence, photoreflectance, comparison, CuGaSe$_{2}$

Abstract: Photoluminescence (PL) spectroscopy and photoreflectance (PR) spectroscopy are very useful techniques for studying the properties of materials. In this paper, the same material of Cu-rich metal-organic vapour phase epitaxy (MOVPE) grown CuGaSe$_{2}$ layer is investigated in a temperature range from 20 to 300 K to compare these two techniques. Both PL and PR spectra appear red shifted, less intense and broadened. The temperature dependence of interband transitions is studied by using the Manoogian--Leclerc equation. The values of the band gap energy at $T$=0 K and the effective phonon temperature are estimated. The temperature dependences of intensities and broadenings of PL and PR spectral lines are also analysed. Based on the results of the comparison, the features and applications of the PL and PR can be shown in detail.

Key words: photoluminescence, photoreflectance, comparison, CuGaSe$_{2}$

中图分类号:  (Other solid inorganic materials)

  • 78.55.Hx
78.66.Li (Other semiconductors) 81.15.Gh (Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)) 81.15.Kk (Vapor phase epitaxy; growth from vapor phase)