X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V2O5 THIN FILM

doi:10.1088/1004-423X/8/1/010

中国物理B ›› 1999, Vol. 8 ›› Issue (1): 57-62.doi: 10.1088/1004-423X/8/1/010

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇下一篇

X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V₂O₅ THIN FILM

王忠春, 李智勇, 陈晓峰, 胡行方

Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China

收稿日期:1998-05-06 出版日期:1999-01-20 发布日期:1999-01-20
基金资助:
Project supported by the National Climbing Program of China (Grant No.07-01) and the National Natural Science Foundation of China (Grant No.59782006).

X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V₂O₅ THIN FILM

Wang Zhong-chun (王忠春), Li Zhi-yong (李智勇), Chen Xiao-feng (陈晓峰), Hu Xing-fang (胡行方)

Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China

Received:1998-05-06 Online:1999-01-20 Published:1999-01-20
Supported by:
Project supported by the National Climbing Program of China (Grant No.07-01) and the National Natural Science Foundation of China (Grant No.59782006).

摘要/Abstract

摘要： Nanocrystalline V₂O₅ thin films were reactively radio-frequency magnetron-sputtered under optimal deposition parameters. Their electrochemical and electrochromic characteristics were investigated by cyclic voltammetry and in-situ monochromatic transmittance measurements. Upon lithium intercalation, V₂O₅ thin films showed a double electrochromic behavior depending on the wavelength and the intercalation extent. X-ray photoelectron spectroscopy results showed that part of the V⁵⁺ in V₂O₅ was reduced to V⁴⁺ during the Li⁺ intercalation process.

Abstract: Nanocrystalline V₂O₅ thin films were reactively radio-frequency magnetron-sputtered under optimal deposition parameters. Their electrochemical and electrochromic characteristics were investigated by cyclic voltammetry and in-situ monochromatic transmittance measurements. Upon lithium intercalation, V₂O₅ thin films showed a double electrochromic behavior depending on the wavelength and the intercalation extent. X-ray photoelectron spectroscopy results showed that part of the V⁵⁺ in V₂O₅ was reduced to V⁴⁺ during the Li⁺ intercalation process.

中图分类号: (Clean metal, semiconductor, and insulator surfaces)

79.60.Bm

78.20.Jq (Electro-optical effects) 78.66.Db (Elemental semiconductors and insulators)

王忠春, 李智勇, 陈晓峰, 胡行方. X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V₂O₅ THIN FILM[J]. 中国物理B, 1999, 8(1): 57-62.

Wang Zhong-chun (王忠春), Li Zhi-yong (李智勇), Chen Xiao-feng (陈晓峰), Hu Xing-fang (胡行方). X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V₂O₅ THIN FILM[J]. Acta Physica Sinica (Overseas Edition), 1999, 8(1): 57-62.

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X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V₂O₅ THIN FILM

X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON ELECTROCHROMIC V₂O₅ THIN FILM

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