中国物理B ›› 2025, Vol. 34 ›› Issue (4): 46105-046105.doi: 10.1088/1674-1056/adb261

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Microstructure and microwave surface resistance of YBCO films deposited under different oxygen pressures

Zhi-Bo Sheng(盛智博)1, Fu-Cong Chen(陈赋聪)2, Pei-Yu Xiong(熊沛雨)2, Qi-Ru Yi(易栖如)1, Jie Yuan(袁洁)1,2, Yu Chen(陈雨)3, Yue-Liang Gu(顾月良)4, Kui Jin(金魁)1,2, Huan-Hua Wang(王焕华)3, Xiao-Long Li(李晓龙)4, and Chen Gao(高琛)1,†   

  1. 1 School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China;
    2 Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    3 Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China;
    4 Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 200120, China
  • 收稿日期:2024-11-05 修回日期:2025-01-23 接受日期:2025-02-05 出版日期:2025-04-15 发布日期:2025-04-15
  • 通讯作者: Chen Gao E-mail:gaochen@ucas.edu.cn
  • 基金资助:
    Project support by the National Key Research and Development Program of China (Grant No. 2022YFA1603900), the National Natural Science Foundation of China – Beijing Joint Fund (Grant No. U23A6015), Central University Basic Research Fund of China (Grant No. E1E40207X2), and the Funds from University of Chinese Academy of Sciences (Grant Nos. E1EG0210X2 and 118900M018).

Microstructure and microwave surface resistance of YBCO films deposited under different oxygen pressures

Zhi-Bo Sheng(盛智博)1, Fu-Cong Chen(陈赋聪)2, Pei-Yu Xiong(熊沛雨)2, Qi-Ru Yi(易栖如)1, Jie Yuan(袁洁)1,2, Yu Chen(陈雨)3, Yue-Liang Gu(顾月良)4, Kui Jin(金魁)1,2, Huan-Hua Wang(王焕华)3, Xiao-Long Li(李晓龙)4, and Chen Gao(高琛)1,†   

  1. 1 School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China;
    2 Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    3 Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China;
    4 Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 200120, China
  • Received:2024-11-05 Revised:2025-01-23 Accepted:2025-02-05 Online:2025-04-15 Published:2025-04-15
  • Contact: Chen Gao E-mail:gaochen@ucas.edu.cn
  • Supported by:
    Project support by the National Key Research and Development Program of China (Grant No. 2022YFA1603900), the National Natural Science Foundation of China – Beijing Joint Fund (Grant No. U23A6015), Central University Basic Research Fund of China (Grant No. E1E40207X2), and the Funds from University of Chinese Academy of Sciences (Grant Nos. E1EG0210X2 and 118900M018).

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摘要： YBa$_{2}$Cu$_{3}$O$_{7-x}$ (YBCO) films with low microwave surface resistance ($R_{\rm S}$) are essential for high temperature superconducting microwave devices. The oxygen pressure during deposition has been found to influence $R_{\rm S}$ significantly. In this work, we deposited highly $c$-axis aligned YBCO films on single crystal MgO (001) substrates under different oxygen pressures via pulsed laser ablation. Their detailed microstructure was characterized with three-dimensional reciprocal space mapping (3D-RSM) method and their microwave surface resistance was also measured with resonant cavity perturbation method. We found that the variation of oxygen pressure can affect film microstructure, including grain orientation distribution and the concentration of crystal defects. The microstructure modulation can explain $R_{\rm S}$ dependence on the oxygen pressure.

关键词: microstructure, microwave surface resistance, reciprocal space mapping, YBCO films

Abstract: YBa$_{2}$Cu$_{3}$O$_{7-x}$ (YBCO) films with low microwave surface resistance ($R_{\rm S}$) are essential for high temperature superconducting microwave devices. The oxygen pressure during deposition has been found to influence $R_{\rm S}$ significantly. In this work, we deposited highly $c$-axis aligned YBCO films on single crystal MgO (001) substrates under different oxygen pressures via pulsed laser ablation. Their detailed microstructure was characterized with three-dimensional reciprocal space mapping (3D-RSM) method and their microwave surface resistance was also measured with resonant cavity perturbation method. We found that the variation of oxygen pressure can affect film microstructure, including grain orientation distribution and the concentration of crystal defects. The microstructure modulation can explain $R_{\rm S}$ dependence on the oxygen pressure.

Key words: microstructure, microwave surface resistance, reciprocal space mapping, YBCO films

中图分类号:  (X-ray diffraction)

  • 61.05.cp
74.72.-h (Cuprate superconductors) 91.60.Ed (Crystal structure and defects, microstructure) 68.55.-a (Thin film structure and morphology)