中国物理B ›› 2017, Vol. 26 ›› Issue (7): 77101-077101.doi: 10.1088/1674-1056/26/7/077101
• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇 下一篇
Jing Yang(杨静), De-Gang Zhao(赵德刚), De-Sheng Jiang(江德生), Ping Chen(陈平), Zong-Shun Liu(刘宗顺), Jian-Jun Zhu(朱建军), Xiang Li(李翔), Wei Liu(刘炜), Feng Liang(梁锋), Li-Qun Zhang(张立群), Hui Yang(杨 辉), Wen-Jie Wang(王文杰), Mo Li(李沫)
Jing Yang(杨静)1, De-Gang Zhao(赵德刚)1,2, De-Sheng Jiang(江德生)1, Ping Chen(陈平)1, Zong-Shun Liu(刘宗顺)1, Jian-Jun Zhu(朱建军)1, Xiang Li(李翔)1, Wei Liu(刘炜)1, Feng Liang(梁锋)1, Li-Qun Zhang(张立群)3, Hui Yang(杨 辉)1,3, Wen-Jie Wang(王文杰)4, Mo Li(李沫)4
摘要:
Physical implications of the activation energy derived from temperature dependent photoluminescence (PL) of InGaN-based materials are investigated, finding that the activation energy is determined by the thermal decay processes involved. If the carrier escaping from localization states is responsible for the thermal quenching of PL intensity, as often occurs in InGaN materials, the activation energy is related to the energy barrier height of localization states. An alternative possibility for the thermal decay of the PL intensity is the activation of nonradiative recombination processes, in which case thermal activation energy would be determined by the carrier capture process of the nonradiative recombination centers rather than by the ionization energy of the defects themselves.
中图分类号: (Semiconductor compounds)