中国物理B ›› 2017, Vol. 26 ›› Issue (6): 66801-066801.doi: 10.1088/1674-1056/26/6/066801

• CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES • 上一篇    下一篇

Direct measurements of conductivity and mobility in millimeter-sized single-crystalline graphene via van der Pauw geometry

Rui-Song Ma(马瑞松), Qing Huan(郇庆), Liang-Mei Wu(吴良妹), Jia-Hao Yan(严佳浩), Yu-Yang Zhang(张余洋), Li-Hong Bao(鲍丽宏), Yun-Qi Liu(刘云圻), Shi-Xuan Du(杜世萱), Hong-Jun Gao(高鸿钧)   

  1. 1 Institute of Physics & School of Physical Sciences, University of Chinese Academy of Sciences(CAS), Beijing 100190, China;
    2 CAS Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing 100049, China;
    3 Beijing Key Laboratory for Nanomaterials and Nanodevices, Beijing 100190, China;
    4 Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China
  • 收稿日期:2017-03-14 修回日期:2017-04-10 出版日期:2017-06-05 发布日期:2017-06-05
  • 通讯作者: Li-Hong Bao, Hong-Jun Gao E-mail:lhbao@iphy.ac.cn;hjgao@iphy.ac.cn
  • 基金资助:

    Project supported by the Science Fund from the Ministry of Science and Technology of China (Grant No. 2013CBA01600), the National Key Research & Development Project of China (Grant No. 2016YFA0202300), the National Natural Science Foundation of China (Grant Nos. 61474141, 61674170, 61335006, 61390501, 51325204, and 51210003), the Chinese Academy of Sciences (CAS), and Youth Innovation Promotion Association of CAS (Grant No. 20150005).

Direct measurements of conductivity and mobility in millimeter-sized single-crystalline graphene via van der Pauw geometry

Rui-Song Ma(马瑞松)1,2,3, Qing Huan(郇庆)1,2,3, Liang-Mei Wu(吴良妹)1,2,3, Jia-Hao Yan(严佳浩)1,2,3, Yu-Yang Zhang(张余洋)2, Li-Hong Bao(鲍丽宏)1,2,3, Yun-Qi Liu(刘云圻)4, Shi-Xuan Du(杜世萱)1,2,3, Hong-Jun Gao(高鸿钧)1,2,3   

  1. 1 Institute of Physics & School of Physical Sciences, University of Chinese Academy of Sciences(CAS), Beijing 100190, China;
    2 CAS Key Laboratory of Vacuum Physics, University of Chinese Academy of Sciences, Beijing 100049, China;
    3 Beijing Key Laboratory for Nanomaterials and Nanodevices, Beijing 100190, China;
    4 Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China
  • Received:2017-03-14 Revised:2017-04-10 Online:2017-06-05 Published:2017-06-05
  • Contact: Li-Hong Bao, Hong-Jun Gao E-mail:lhbao@iphy.ac.cn;hjgao@iphy.ac.cn
  • Supported by:

    Project supported by the Science Fund from the Ministry of Science and Technology of China (Grant No. 2013CBA01600), the National Key Research & Development Project of China (Grant No. 2016YFA0202300), the National Natural Science Foundation of China (Grant Nos. 61474141, 61674170, 61335006, 61390501, 51325204, and 51210003), the Chinese Academy of Sciences (CAS), and Youth Innovation Promotion Association of CAS (Grant No. 20150005).

摘要:

We report the direct measurements of conductivity and mobility in millimeter-sized single-crystalline graphene on SiO2/Si via van der Pauw geometry by using a home-designed four-probe scanning tunneling microscope (4P-STM). The gate-tunable conductivity and mobility are extracted from standard van der Pauw resistance measurements where the four STM probes contact the four peripheries of hexagonal graphene flakes, respectively. The high homogeneity of transport properties of the single-crystalline graphene flake is confirmed by comparing the extracted conductivities and mobilities from three setups with different geometry factors. Our studies provide a reliable solution for directly evaluating the entire electrical properties of graphene in a non-invasive way and could be extended to characterizing other two-dimensional materials.

关键词: graphene conductivity, mobility, four-probe measurement, van der Pauw method

Abstract:

We report the direct measurements of conductivity and mobility in millimeter-sized single-crystalline graphene on SiO2/Si via van der Pauw geometry by using a home-designed four-probe scanning tunneling microscope (4P-STM). The gate-tunable conductivity and mobility are extracted from standard van der Pauw resistance measurements where the four STM probes contact the four peripheries of hexagonal graphene flakes, respectively. The high homogeneity of transport properties of the single-crystalline graphene flake is confirmed by comparing the extracted conductivities and mobilities from three setups with different geometry factors. Our studies provide a reliable solution for directly evaluating the entire electrical properties of graphene in a non-invasive way and could be extended to characterizing other two-dimensional materials.

Key words: graphene conductivity, mobility, four-probe measurement, van der Pauw method

中图分类号:  (Scanning tunneling microscopy (including chemistry induced with STM))

  • 68.37.Ef
81.15.Gh (Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)) 72.80.Vp (Electronic transport in graphene)