中国物理B ›› 2024, Vol. 33 ›› Issue (9): 96803-096803.doi: 10.1088/1674-1056/ad6259

所属专题: SPECIAL TOPIC — Stephen J. Pennycook: A research life in atomic-resolution STEM and EELS

• • 上一篇    下一篇

Revealing the microstructures of metal halide perovskite thin films via advanced transmission electron microscopy

Yeming Xian(冼业铭), Xiaoming Wang(王晓明), and Yanfa Yan(鄢炎发)†   

  1. Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and Commercialization, The University of Toledo, Toledo, Ohio 43606, United States
  • 收稿日期:2024-04-03 修回日期:2024-05-15 接受日期:2024-07-12 出版日期:2024-09-15 发布日期:2024-08-30
  • 通讯作者: Yanfa Yan E-mail:yanfa.yan@utoledo.edu

Revealing the microstructures of metal halide perovskite thin films via advanced transmission electron microscopy

Yeming Xian(冼业铭), Xiaoming Wang(王晓明), and Yanfa Yan(鄢炎发)†   

  1. Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and Commercialization, The University of Toledo, Toledo, Ohio 43606, United States
  • Received:2024-04-03 Revised:2024-05-15 Accepted:2024-07-12 Online:2024-09-15 Published:2024-08-30
  • Contact: Yanfa Yan E-mail:yanfa.yan@utoledo.edu

摘要: Metal halide perovskites (MHPs) are excellent semiconductors that have led to breakthroughs in applications in thin-film solar cells, detectors, and light-emitting diodes due to their remarkable optoelectronic properties and defect tolerance. However, the performance and stability of MHP-based devices are significantly influenced by their microstructures including the formation of defects, composition fluctuations, structural inhomogeneity, etc. Transmission electron microscopy (TEM) is a powerful tool for direct observation of microstructure at the atomic-scale resolution and has been used to correlate the microstructure and performance of MHP-based devices. In this review, we highlight the application of TEM techniques in revealing the microstructures of MHP thin films at the atomic scale. The results provide critical understanding of the performance of MHP devices and guide the design of strategies for improving the performance and stability of MHP devices.

关键词: perovskite, defect, inhomogeneity, transmission electron microscopy

Abstract: Metal halide perovskites (MHPs) are excellent semiconductors that have led to breakthroughs in applications in thin-film solar cells, detectors, and light-emitting diodes due to their remarkable optoelectronic properties and defect tolerance. However, the performance and stability of MHP-based devices are significantly influenced by their microstructures including the formation of defects, composition fluctuations, structural inhomogeneity, etc. Transmission electron microscopy (TEM) is a powerful tool for direct observation of microstructure at the atomic-scale resolution and has been used to correlate the microstructure and performance of MHP-based devices. In this review, we highlight the application of TEM techniques in revealing the microstructures of MHP thin films at the atomic scale. The results provide critical understanding of the performance of MHP devices and guide the design of strategies for improving the performance and stability of MHP devices.

Key words: perovskite, defect, inhomogeneity, transmission electron microscopy

中图分类号:  (Composition, segregation; defects and impurities)

  • 68.35.Dv
68.37.Lp (Transmission electron microscopy (TEM)) 68.37.Ma (Scanning transmission electron microscopy (STEM)) 68.37.Og (High-resolution transmission electron microscopy (HRTEM))