中国物理B ›› 2018, Vol. 27 ›› Issue (7): 77303-077303.doi: 10.1088/1674-1056/27/7/077303

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

Intrinsic charge transport behaviors in graphene-black phosphorus van der Waals heterojunction devices

Guo-Cai Wang(王国才), Liang-Mei Wu(吴良妹), Jia-Hao Yan(严佳浩), Zhang Zhou(周璋), Rui-Song Ma(马瑞松), Hai-Fang Yang(杨海方), Jun-Jie Li(李俊杰), Chang-Zhi Gu(顾长志), Li-Hong Bao(鲍丽宏), Shi-Xuan Du(杜世萱), Hong-Jun Gao(高鸿钧)   

  1. 1 Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    2 University of Chinese Academy of Sciences, Beijing 100190, China
  • 收稿日期:2018-03-29 修回日期:2018-04-16 出版日期:2018-07-05 发布日期:2018-07-05
  • 通讯作者: Li-Hong Bao E-mail:lhbao@iphy.ac.cn
  • 基金资助:

    Project supported by the National Basic Research Program of China (Grant No. 2013CBA01600), the National Key Research & Development Project of China (Grant No. 2016YFA0202300), the National Natural Science Foundation of China (Grant Nos. 61474141, 61674170, 61335006, 61390501, 51325204, and 51210003), Youth Innovation Promotion Association of Chinese Academy of Sciences (Grant No. 20150005), and the China Postdoctoral Science Foundation (Grant No. 2017M623146).

Intrinsic charge transport behaviors in graphene-black phosphorus van der Waals heterojunction devices

Guo-Cai Wang(王国才)1,2, Liang-Mei Wu(吴良妹)1,2, Jia-Hao Yan(严佳浩)1,2, Zhang Zhou(周璋)1,2, Rui-Song Ma(马瑞松)1,2, Hai-Fang Yang(杨海方)1,2, Jun-Jie Li(李俊杰)1,2, Chang-Zhi Gu(顾长志)1,2, Li-Hong Bao(鲍丽宏)1,2, Shi-Xuan Du(杜世萱)1,2, Hong-Jun Gao(高鸿钧)1,2   

  1. 1 Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    2 University of Chinese Academy of Sciences, Beijing 100190, China
  • Received:2018-03-29 Revised:2018-04-16 Online:2018-07-05 Published:2018-07-05
  • Contact: Li-Hong Bao E-mail:lhbao@iphy.ac.cn
  • Supported by:

    Project supported by the National Basic Research Program of China (Grant No. 2013CBA01600), the National Key Research & Development Project of China (Grant No. 2016YFA0202300), the National Natural Science Foundation of China (Grant Nos. 61474141, 61674170, 61335006, 61390501, 51325204, and 51210003), Youth Innovation Promotion Association of Chinese Academy of Sciences (Grant No. 20150005), and the China Postdoctoral Science Foundation (Grant No. 2017M623146).

摘要:

Heterostructures from mechanically-assembled stacks of two-dimensional materials allow for versatile electronic device applications. Here, we demonstrate the intrinsic charge transport behaviors in graphene-black phosphorus heterojunction devices under different charge carrier densities and temperature regimes. At high carrier densities or in the ON state, tunneling through the Schottky barrier at the interface between graphene and black phosphorus dominates at low temperatures. With temperature increasing, the Schottky barrier at the interface is vanishing, and the channel current starts to decrease with increasing temperature, behaving like a metal. While at low carrier densities or in the OFF state, thermal emission over the Schottky barrier at the interface dominates the carriers transport process. A barrier height of ~67.3 meV can be extracted from the thermal emission-diffusion theory.

关键词: black phosphorus, heterojunction, contact, barrier height

Abstract:

Heterostructures from mechanically-assembled stacks of two-dimensional materials allow for versatile electronic device applications. Here, we demonstrate the intrinsic charge transport behaviors in graphene-black phosphorus heterojunction devices under different charge carrier densities and temperature regimes. At high carrier densities or in the ON state, tunneling through the Schottky barrier at the interface between graphene and black phosphorus dominates at low temperatures. With temperature increasing, the Schottky barrier at the interface is vanishing, and the channel current starts to decrease with increasing temperature, behaving like a metal. While at low carrier densities or in the OFF state, thermal emission over the Schottky barrier at the interface dominates the carriers transport process. A barrier height of ~67.3 meV can be extracted from the thermal emission-diffusion theory.

Key words: black phosphorus, heterojunction, contact, barrier height

中图分类号:  (Tunneling)

  • 73.40.Gk
73.40.Ei (Rectification) 73.40.Cg (Contact resistance, contact potential) 73.40.Lq (Other semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions)