Damage threshold influenced by polishing imperfection distribution under 355-nm laser irradiation

doi:10.1088/1674-1056/26/10/104210

中国物理B ›› 2017, Vol. 26 ›› Issue (10): 104210-104210.doi: 10.1088/1674-1056/26/10/104210

• ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS • 上一篇下一篇

Damage threshold influenced by polishing imperfection distribution under 355-nm laser irradiation

Zhen Yu(余振), Hong-Ji Qi(齐红基), Wei-Li Zhang(张伟丽), Hu Wang(王虎), Bin Wang(王斌), Yue-Liang Wang(王岳亮), Hao-Peng Huang(黄昊鹏)

1. Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Shanghai 201800, China;
2. University of Chinese Academy of Sciences, Beijing 100049, China

收稿日期:2017-03-10 修回日期:2017-05-12 出版日期:2017-10-05 发布日期:2017-10-05
通讯作者: Hong-Ji Qi E-mail:qhj@siom.ac.cn

Damage threshold influenced by polishing imperfection distribution under 355-nm laser irradiation

Zhen Yu(余振)^1,2, Hong-Ji Qi(齐红基)¹, Wei-Li Zhang(张伟丽)¹, Hu Wang(王虎)^1,2, Bin Wang(王斌)^1,2, Yue-Liang Wang(王岳亮)^1,2, Hao-Peng Huang(黄昊鹏)^1,2

1. Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Shanghai 201800, China;
2. University of Chinese Academy of Sciences, Beijing 100049, China

Received:2017-03-10 Revised:2017-05-12 Online:2017-10-05 Published:2017-10-05
Contact: Hong-Ji Qi E-mail:qhj@siom.ac.cn

摘要/Abstract

摘要： A systematic interpretation of laser-induced damage in the nanosecond regime is realized with a defect distribution buried inside the redeposited layer arising from a polishing process. Under the 355-nm laser irradiation, the size dependence of the defect embedded in the fused silica can be illustrated through the thermal conduction model. Considering CeO₂ as the major initiator, the size distribution with the power law model is determined from the damage probability statistics. To verify the accuracy of the size distribution, the ion output scaling with depth for the inclusion element is obtained with the secondary ion mass spectrometer. For CeO₂ particulates in size of the depth interval with ion output satisfied in the negative exponential form, the corresponding density is consistent with that of the identical size in the calculated size distribution. This coincidence implies an alternative method for the density analysis of photoactive imperfections within optical components at the semi-quantitative level based on the laser damage tests.

关键词: laser-induced damage, size distribution, photoactive imperfection

Abstract: A systematic interpretation of laser-induced damage in the nanosecond regime is realized with a defect distribution buried inside the redeposited layer arising from a polishing process. Under the 355-nm laser irradiation, the size dependence of the defect embedded in the fused silica can be illustrated through the thermal conduction model. Considering CeO₂ as the major initiator, the size distribution with the power law model is determined from the damage probability statistics. To verify the accuracy of the size distribution, the ion output scaling with depth for the inclusion element is obtained with the secondary ion mass spectrometer. For CeO₂ particulates in size of the depth interval with ion output satisfied in the negative exponential form, the corresponding density is consistent with that of the identical size in the calculated size distribution. This coincidence implies an alternative method for the density analysis of photoactive imperfections within optical components at the semi-quantitative level based on the laser damage tests.

Key words: laser-induced damage, size distribution, photoactive imperfection

中图分类号: (Laser materials)

42.70.Hj

68.55.Ln (Defects and impurities: doping, implantation, distribution, concentration, etc.) 78.20.nb (Photothermal effects)

余振, 齐红基, 张伟丽, 王虎, 王斌, 王岳亮, 黄昊鹏. Damage threshold influenced by polishing imperfection distribution under 355-nm laser irradiation[J]. 中国物理B, 2017, 26(10): 104210-104210.

Zhen Yu(余振), Hong-Ji Qi(齐红基), Wei-Li Zhang(张伟丽), Hu Wang(王虎), Bin Wang(王斌), Yue-Liang Wang(王岳亮), Hao-Peng Huang(黄昊鹏). Damage threshold influenced by polishing imperfection distribution under 355-nm laser irradiation[J]. Chin. Phys. B, 2017, 26(10): 104210-104210.

参考文献 16

[1]	Miller P E, Suratwala T I, Bude J D, Laurence T A, Shen N, Steele W A, Feit M D, Menapace J A and Wong L L 2010 Laser Damage Symposium XLI:Annual Symposium on Optical Materials for High Power Lasers, September 21-23, 2009, Colorado, USA, p. 75040X
[2]	Gallais L, Capoulade J, Wagner F, Natoli J Y and Commandre M 2007 Opt. Commun. 272 221
[3]	O'Connell and Robert M 1992 Appl. Opt. 31 4143
[4]	Feit M D and Rubenchik A M 2004 XXXV Annual Symposium on Optical Materials for High Power Lasers:Boulder Damage Symposium, September 20-22, 2003, Colorado, USA, p. 74
[5]	Krol H, Gallais L, Grezes-Besset C, Natoli J Y and Commandréa M 2005 Opt. Commun. 256 184
[6]	Gallais L, Capoulade J, Natoli J Y and Commandré M 2008 J. Appl. Phys. 104 053120
[7]	Liu W W, Wei C Y, Yi K and Shao J D 2015 Chin. Opt. Lett. 13 041407
[8]	Dong Z C, Cheng H B, Ye Y and Tam H Y 2014 Appl. Opt. 53 5841
[9]	Feit M D, Campbell J H, Faux D R, Genin F R, Kozlowski M R, Rubenchik A M, Riddle R A, Salleo A and Yoshiyama J M 1998 Laser-induced damage in optical materials, October 6-8, 1997, Colorado, USA, p. 350
[10]	Gao X, Feng G Y, Han J H, Chen N J, T C and Zhou S H 2012 Appl. Opt. 51 2463
[11]	Papernov S and Schmid A W 2002 J. Appl. Phys. 92 5720
[12]	Bude J, Guss G, Matthews M and Spaeth M L 2007 Boulder Damage Symposium XXXIX:Annual Symposium on Optical Materials for High Power Lasers, September 24-26, 2007, Colorado, USA, p. 672009
[13]	Negres R A, Liao Z M, Abdulla G M, Cross D A, Norton M A and Carr C W 2011 Appl. Opt. 50 D12
[14]	ISO21254-12011"Lasers and Laser-Related Equipment-Methods for Laser-Irradiation-Induced Damage Threshold-Part 1:Definitions and General Principles"
[15]	Porteus J O and Seitel S C 1984 Appl. Opt. 23 3796
[16]	Kozlowski M R, Carr J, Hutcheon I D, Torres R A, Sheehan L M, Camp D W and Yan M 1998 Laser-Induced Damage in Optical Materials, October 6-8,1997, Colorado, USA, p. 365

Damage threshold influenced by polishing imperfection distribution under 355-nm laser irradiation

Damage threshold influenced by polishing imperfection distribution under 355-nm laser irradiation

RichHTML

PDF (PC)

赞

可视化

摘要/Abstract

引用本文

使用本文

参考文献 16

相关文章 15

Metrics

本文评价

推荐阅读 0

[1]	时洁, 刘宇林, 时胜国, 邓安定, 李洪道. Inversion method of bubble size distribution based on acoustic nonlinear coefficient measurement[J]. 中国物理B, 2020, 29(8): 84301-084301.
[2]	闫春燕, 刘宝安, 李香草, 刘畅, 巨新. Time-dependent photothermal characterization on damage of fused silica induced by pulsed 355-nm laser with high repetition rate[J]. 中国物理B, 2020, 29(2): 27901-027901.
[3]	方美华, 田鹏宇, 朱茂东, 齐红基, 费涛, 吕金鹏, 刘会平. Laser-induced damage threshold in HfO₂/SiO₂ multilayer films irradiated by β-ray[J]. 中国物理B, 2019, 28(2): 24215-024215.
[4]	S Rizwan Ali, Farah Naz, Humaira Akber, M Naeem, S Imran Ali, S Abdul Basit, M Sarim, Sadaf Qaseem. Effect of particle size distribution on magnetic behavior of nanoparticles with uniaxial anisotropy[J]. 中国物理B, 2018, 27(9): 97503-097503.
[5]	章瑛, 王胭脂, 赵娇玲, 邵建达, 阮双琛. Experimental demonstration of narrow-band rugate minus filters using rapidly alternating deposition technology[J]. 中国物理B, 2018, 27(5): 54217-054217.
[6]	贺振宗, 梁栋, 毛军逵, 韩省思. Simultaneous estimation of aerosol optical constants and size distribution from angular light-scattering measurement signals[J]. 中国物理B, 2018, 27(5): 59101-059101.
[7]	何祥, 赵恒, 王刚, 周佩璠, 马平. Correlation of polishing-induced shallow subsurface damages with laser-induced gray haze damages in fused silica optics[J]. 中国物理B, 2016, 25(8): 88105-088105.
[8]	何祥, 王刚, 赵恒, 马平. Subsurface defect characterization and laser-induced damage performance of fused silica optics polished with colloidal silica and ceria[J]. 中国物理B, 2016, 25(4): 48104-048104.
[9]	杨亮, 向霞, 苗心向, 李莉, 袁晓东, 晏中华, 周国瑞, 吕海兵, 郑万国, 祖小涛. Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica[J]. 中国物理B, 2016, 25(1): 14210-014210.
[10]	章瑛, 齐红基, 易葵, 王胭脂, 隋展, 邵建达. Analysis of the spatial filter of a dielectric multilayer film reflective cutoff filter-combination device[J]. 中国物理B, 2015, 24(10): 104216-104216.
[11]	李莉, 向霞, 袁晓东, 贺少勃, 蒋晓东, 郑万国, 祖小涛. Effect of fused silica subsurface defect site density on light intensification[J]. 中国物理B, 2013, 22(5): 54207-054207.
[12]	韩伟, 王芳, 周丽丹, 冯斌, 贾怀庭, 李恪宇, 向勇, 郑万国 . The effect of laser beam size on laser-induced damage performance[J]. 中国物理B, 2012, 21(7): 77901-077901.
[13]	杨秀峰, 王善进, 陈建敏, 石玉仁, 林麦麦, 段文山. Effect of multicomponent dust grains in a cold quantum dusty plasma[J]. 中国物理B, 2012, 21(5): 55202-055202.
[14]	王坤鹏, 黄烨. Formation energies and electronic structures of native point defects in potassium dihydrogen phosphate[J]. 中国物理B, 2011, 20(7): 77401-077401.
[15]	李莉, 向霞, 祖小涛, 王海军, 袁晓东, 蒋晓东, 郑万国, 戴威. Numerical simulation of the modulation to incident laser by the repaired damage site in a fused silica subsurface[J]. 中国物理B, 2011, 20(7): 74209-074209.