Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

doi:10.1088/1674-1056/25/1/014210

中国物理B ›› 2016, Vol. 25 ›› Issue (1): 14210-014210.doi: 10.1088/1674-1056/25/1/014210

• ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS • 上一篇下一篇

Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

1. School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China;
2. Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China

收稿日期:2015-06-24 修回日期:2015-08-14 出版日期:2016-01-05 发布日期:2016-01-05
通讯作者: Xia Xiang, Xin-Xiang Miao E-mail:xiaxiang@uestc.edu.cn;miaoxinxiang.714@163.com
基金资助:
Project supported by the National Natural Science Foundation of China (Grant No. 61178018) and the Ph.D. Funding Support Program of Education Ministry of China (Grant No. 20110185110007).

Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

Liang Yang(杨亮)^1,2, Xia Xiang(向霞)¹, Xin-Xiang Miao(苗心向)², Li Li(李莉)¹, Xiao-Dong Yuan(袁晓东)², Zhong-Hua Yan(晏中华)¹, Guo-Rui Zhou(周国瑞)², Hai-Bing Lv(吕海兵)², Wan-Guo Zheng(郑万国)², Xiao-Tao Zu(祖小涛)¹

1. School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China;
2. Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China

Received:2015-06-24 Revised:2015-08-14 Online:2016-01-05 Published:2016-01-05
Contact: Xia Xiang, Xin-Xiang Miao E-mail:xiaxiang@uestc.edu.cn;miaoxinxiang.714@163.com
Supported by:
Project supported by the National Natural Science Foundation of China (Grant No. 61178018) and the Ph.D. Funding Support Program of Education Ministry of China (Grant No. 20110185110007).

摘要/Abstract

摘要： Modulation caused by surface/subsurface contaminants is one of the important factors for laser-induced damage of fused silica. In this work, a three-dimensional finite-difference time-domain (3D-FDTD) method is employed to simulate the electric field intensity distribution in the vicinity of particulate contaminants on fused silica surface. The simulated results reveal that the contaminant on both the input and output surfaces plays an important role in the electric field modulation of the incident laser. The influences of the shape, size, embedded depth, dielectric constant (ε_r), and the number of contaminant particles on the electric field distribution are discussed in detail. Meanwhile, the corresponding physical mechanism is analyzed theoretically.

关键词: fused silica, laser-induced damage, particulate contaminants, modulation

Abstract: Modulation caused by surface/subsurface contaminants is one of the important factors for laser-induced damage of fused silica. In this work, a three-dimensional finite-difference time-domain (3D-FDTD) method is employed to simulate the electric field intensity distribution in the vicinity of particulate contaminants on fused silica surface. The simulated results reveal that the contaminant on both the input and output surfaces plays an important role in the electric field modulation of the incident laser. The influences of the shape, size, embedded depth, dielectric constant (ε_r), and the number of contaminant particles on the electric field distribution are discussed in detail. Meanwhile, the corresponding physical mechanism is analyzed theoretically.

Key words: fused silica, laser-induced damage, particulate contaminants, modulation

中图分类号: (Glasses, quartz)

42.70.Ce

61.80.Ba (Ultraviolet, visible, and infrared radiation effects (including laser radiation)) 68.49.-h (Surface characterization by particle-surface scattering) 78.20.Bh (Theory, models, and numerical simulation)

杨亮, 向霞, 苗心向, 李莉, 袁晓东, 晏中华, 周国瑞, 吕海兵, 郑万国, 祖小涛. Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica[J]. 中国物理B, 2016, 25(1): 14210-014210.

Liang Yang(杨亮), Xia Xiang(向霞), Xin-Xiang Miao(苗心向), Li Li(李莉), Xiao-Dong Yuan(袁晓东), Zhong-Hua Yan(晏中华), Guo-Rui Zhou(周国瑞), Hai-Bing Lv(吕海兵), Wan-Guo Zheng(郑万国), Xiao-Tao Zu(祖小涛). Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica[J]. Chin. Phys. B, 2016, 25(1): 14210-014210.

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Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

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