中国物理B ›› 2015, Vol. 24 ›› Issue (10): 107102-107102.doi: 10.1088/1674-1056/24/10/107102

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

Nano LaAlO3 buffer layer-assisted tunneling current in manganite p-n heterojunction

马俊杰a, 王登京a b, 黄海林a, 汪汝武b, 李云宝a   

  1. a Department of Applied Physics, Wuhan University of Science and Technology, Wuhan 430081, China;
    b Hubei Provincial Key Laboratory of System Science in Metallurgical Process, Wuhan 430065, China
  • 收稿日期:2015-04-23 修回日期:2015-05-18 出版日期:2015-10-05 发布日期:2015-10-05
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 10804089).

Nano LaAlO3 buffer layer-assisted tunneling current in manganite p-n heterojunction

Ma Jun-Jie (马俊杰)a, Wang Deng-Jing (王登京)a b, Huang Hai-Lin (黄海林)a, Wang Ru-Wu (汪汝武)b, Li Yun-Bao (李云宝)a   

  1. a Department of Applied Physics, Wuhan University of Science and Technology, Wuhan 430081, China;
    b Hubei Provincial Key Laboratory of System Science in Metallurgical Process, Wuhan 430065, China
  • Received:2015-04-23 Revised:2015-05-18 Online:2015-10-05 Published:2015-10-05
  • Contact: Wang Deng-Jing E-mail:d.j.wang@163.com
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 10804089).

摘要: An oxide p-n heterojunction composed of a 150-nm La0.67Ca0.33MnO3 (LCMO) film, 0.05 wt% Nb doped SrTiO3 substrate (STON), and sandwiched 5-nm LaAlO3 (LAO) thin film is fabricated with the pulsed laser deposition technique and the interfacial transport properties are experimentally studied. The rectifying behavior of the junction is in agreement with Newman's equation, indicating that tunneling is the dominant process for the carriers to pass through the interface while thermal emission is the dominant transport model of an LCMO/STON heterojunction with no LAO buffer layer.

关键词: manganite, heterojunction, tunneling

Abstract: An oxide p-n heterojunction composed of a 150-nm La0.67Ca0.33MnO3 (LCMO) film, 0.05 wt% Nb doped SrTiO3 substrate (STON), and sandwiched 5-nm LaAlO3 (LAO) thin film is fabricated with the pulsed laser deposition technique and the interfacial transport properties are experimentally studied. The rectifying behavior of the junction is in agreement with Newman's equation, indicating that tunneling is the dominant process for the carriers to pass through the interface while thermal emission is the dominant transport model of an LCMO/STON heterojunction with no LAO buffer layer.

Key words: manganite, heterojunction, tunneling

中图分类号:  (Conductivity phenomena in semiconductors and insulators)

  • 72.20.-i
73.40.Lq (Other semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions) 73.40.Gk (Tunneling)