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Xi Chen(陈曦), Jun-Kai Tong(童君开), and Zhi-Xin Hu(胡智鑫). Adaptive semi-empirical model for non-contact atomic force microscopy[J]. 中国物理B, 2022, 31(8): 88202-088202. |
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Fang Wang(王芳), Yushu Shi(施玉书), Wei Li(李伟), Xiao Deng(邓晓), Xinbin Cheng(程鑫彬), Shu Zhang(张树), and Xixi Yu(余茜茜). Characterization of a nano line width reference material based on metrological scanning electron microscope[J]. 中国物理B, 2022, 31(5): 50601-050601. |
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Wenze Gao(高文泽), Chi Zhang(张弛), Zheng Zhou(周正), and Wei Xu(许维). On-surface synthesis of one-dimensional carbyne-like nanostructures with sp-carbon[J]. 中国物理B, 2022, 31(12): 128101-128101. |
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Qi Zheng(郑琦), Li Huang(黄立), Deliang Bao(包德亮), Rongting Wu(武荣庭), Yan Li(李彦), Xiao Lin(林晓), Shixuan Du(杜世萱), and Hong-Jun Gao(高鸿钧). Substrate tuned reconstructed polymerization of naphthalocyanine on Ag(110)[J]. 中国物理B, 2022, 31(1): 18202-018202. |
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Huan Yang(杨欢), Yixuan Gao(高艺璇), Wenhui Niu(牛雯慧), Xiao Chang(常霄), Li Huang(黄立), Junzhi Liu(刘俊治), Yiyong Mai(麦亦勇), Xinliang Feng(冯新亮), Shixuan Du(杜世萱), and Hong-Jun Gao(高鸿钧). Fabrication of sulfur-doped cove-edged graphene nanoribbons on Au(111)[J]. 中国物理B, 2021, 30(7): 77306-077306. |
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Han-Bin Deng(邓翰宾), Yuan Li(李渊), Zili Feng(冯子力), Jian-Yu Guan(关剑宇), Xin Yu(于鑫), Xiong Huang(黄雄), Rui-Zhe Liu(刘睿哲), Chang-Jiang Zhu(朱长江), Limin Liu(刘立民), Ying-Kai Sun(孙英开), Xi-Liang Peng(彭锡亮), Shuai-Shuai Li(李帅帅), Xin Du(杜鑫), Zheng Wang(王铮), Rui Wu(武睿), Jia-Xin Yin(殷嘉鑫), You-Guo Shi(石友国), and Han-Qing Mao(毛寒青). Moiré superlattice modulations in single-unit-cell FeTe films grown on NbSe2 single crystals[J]. 中国物理B, 2021, 30(12): 126801-126801. |
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郑杰允, 刘家亮, 王绥军, 罗飞, 贲留斌, 李泓. Influence of fluoroethylene carbonate on the solid electrolyte interphase of silicon anode for Li-ion batteries: A scanning force spectroscopy study[J]. 中国物理B, 2020, 29(4): 48203-048203. |
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邹正磊, 权楠楠, 王兴亚, 王硕, 周利民, 胡钧, 张立娟, 董亚明. The properties of surface nanobubbles formed on different substrates[J]. 中国物理B, 2018, 27(8): 86803-086803. |
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樊继斌, 程晓姣, 刘红侠, 王树龙, 段理. Improvement of the high-κ/Ge interface thermal stability using an in-situ ozone treatment characterized by conductive atomic force microscopy[J]. 中国物理B, 2017, 26(8): 87701-087701. |
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张勇, 王业亮, 阙炎德, 高鸿钧. Characterizing silicon intercalated graphene grown epitaxially on Ir films by atomic force microscopy[J]. 中国物理B, 2015, 24(7): 78104-078104. |
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刘波, 张森, 尹甲运, 张雄文, 敦少博, 冯志红, 蔡树军. Effect of high-temperature buffer thickness on quality of AlN epilayer grown on sapphire substrate by metalorganic chemical vapor deposition[J]. 中国物理B, 2013, 22(5): 57105-057105. |
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潘秀红, 金蔚青, 刘岩, 艾飞, 金飞, 解俊杰. Optical and atomic force microscopic study on step bunching in BaB2O4 crystal growth[J]. 中国物理B, 2011, 20(2): 28102-028102. |
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