中国物理B ›› 2021, Vol. 30 ›› Issue (12): 126801-126801.doi: 10.1088/1674-1056/ac0816

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Moiré superlattice modulations in single-unit-cell FeTe films grown on NbSe2 single crystals

Han-Bin Deng(邓翰宾)1,2,†, Yuan Li(李渊)1,2,†, Zili Feng(冯子力)1,2, Jian-Yu Guan(关剑宇)1,2, Xin Yu(于鑫)1, Xiong Huang(黄雄)1,2, Rui-Zhe Liu(刘睿哲)1,2, Chang-Jiang Zhu(朱长江)1,2, Limin Liu(刘立民)1,2, Ying-Kai Sun(孙英开)1,2, Xi-Liang Peng(彭锡亮)1,2, Shuai-Shuai Li(李帅帅)1,2, Xin Du(杜鑫)1,2, Zheng Wang(王铮)1,2, Rui Wu(武睿)1,3, Jia-Xin Yin(殷嘉鑫)4, You-Guo Shi(石友国)1,3,5, and Han-Qing Mao(毛寒青)1,‡   

  1. 1 Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    2 School of Physics, University of Chinese Academy of Sciences, Beijing 100049, China;
    3 Songshan Lake Materials Laboratory, Dongguan 523808, China;
    4 Laboratory for Topological Quantum Matter and Spectroscopy(B7), Department of Physics, Princeton University, Princeton, NJ 08544, USA;
    5 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • 收稿日期:2021-03-23 修回日期:2021-06-02 接受日期:2021-06-04 出版日期:2021-11-15 发布日期:2021-11-25
  • 通讯作者: Han-Qing Mao E-mail:mhq@iphy.ac.cn
  • 基金资助:
    Project supported by the National Key Research and Development Program of China (Grant Nos. 2016YFA0302400, 2016YFA0300602, and 2017YFA0302903), the National Natural Science Foundation of China (Grant No. 11227903), the Beijing Municipal Science and Technology Commission, China (Grant Nos. Z181100004218007 and Z191100007219011), the National Basic Research Program of China (Grant No. 2015CB921304), and the Strategic Priority Research Program of Chinese Academy of Sciences (Grant Nos. XDB07000000, XDB28000000, and XDB33000000).

Moiré superlattice modulations in single-unit-cell FeTe films grown on NbSe2 single crystals

Han-Bin Deng(邓翰宾)1,2,†, Yuan Li(李渊)1,2,†, Zili Feng(冯子力)1,2, Jian-Yu Guan(关剑宇)1,2, Xin Yu(于鑫)1, Xiong Huang(黄雄)1,2, Rui-Zhe Liu(刘睿哲)1,2, Chang-Jiang Zhu(朱长江)1,2, Limin Liu(刘立民)1,2, Ying-Kai Sun(孙英开)1,2, Xi-Liang Peng(彭锡亮)1,2, Shuai-Shuai Li(李帅帅)1,2, Xin Du(杜鑫)1,2, Zheng Wang(王铮)1,2, Rui Wu(武睿)1,3, Jia-Xin Yin(殷嘉鑫)4, You-Guo Shi(石友国)1,3,5, and Han-Qing Mao(毛寒青)1,‡   

  1. 1 Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    2 School of Physics, University of Chinese Academy of Sciences, Beijing 100049, China;
    3 Songshan Lake Materials Laboratory, Dongguan 523808, China;
    4 Laboratory for Topological Quantum Matter and Spectroscopy(B7), Department of Physics, Princeton University, Princeton, NJ 08544, USA;
    5 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • Received:2021-03-23 Revised:2021-06-02 Accepted:2021-06-04 Online:2021-11-15 Published:2021-11-25
  • Contact: Han-Qing Mao E-mail:mhq@iphy.ac.cn
  • Supported by:
    Project supported by the National Key Research and Development Program of China (Grant Nos. 2016YFA0302400, 2016YFA0300602, and 2017YFA0302903), the National Natural Science Foundation of China (Grant No. 11227903), the Beijing Municipal Science and Technology Commission, China (Grant Nos. Z181100004218007 and Z191100007219011), the National Basic Research Program of China (Grant No. 2015CB921304), and the Strategic Priority Research Program of Chinese Academy of Sciences (Grant Nos. XDB07000000, XDB28000000, and XDB33000000).

摘要: Interface can be a fertile ground for exotic quantum states, including topological superconductivity, Majorana mode, fractal quantum Hall effect, unconventional superconductivity, Mott insulator, etc. Here we grow single-unit-cell (1UC) FeTe film on NbSe2 single crystal by molecular beam epitaxy (MBE) and investigate the film in-situ with a home-made cryogenic scanning tunneling microscopy (STM) and non-contact atomic force microscopy (AFM) combined system. We find different stripe-like superlattice modulations on grown FeTe film with different misorientation angles with respect to NbSe2 substrate. We show that these stripe-like superlattice modulations can be understood as moiré pattern forming between FeTe film and NbSe2 substrate. Our results indicate that the interface between FeTe and NbSe2 is atomically sharp. By STM-AFM combined measurement, we suggest that the moiré superlattice modulations have an electronic origin when the misorientation angle is relatively small (≤ 3°) and have structural relaxation when the misorientation angle is relatively large (≥ 10°).

关键词: scanning tunneling microscopy (STM), atomic force microscopy (AFM), FeTe film, moiré superlattice, misorientation

Abstract: Interface can be a fertile ground for exotic quantum states, including topological superconductivity, Majorana mode, fractal quantum Hall effect, unconventional superconductivity, Mott insulator, etc. Here we grow single-unit-cell (1UC) FeTe film on NbSe2 single crystal by molecular beam epitaxy (MBE) and investigate the film in-situ with a home-made cryogenic scanning tunneling microscopy (STM) and non-contact atomic force microscopy (AFM) combined system. We find different stripe-like superlattice modulations on grown FeTe film with different misorientation angles with respect to NbSe2 substrate. We show that these stripe-like superlattice modulations can be understood as moiré pattern forming between FeTe film and NbSe2 substrate. Our results indicate that the interface between FeTe and NbSe2 is atomically sharp. By STM-AFM combined measurement, we suggest that the moiré superlattice modulations have an electronic origin when the misorientation angle is relatively small (≤ 3°) and have structural relaxation when the misorientation angle is relatively large (≥ 10°).

Key words: scanning tunneling microscopy (STM), atomic force microscopy (AFM), FeTe film, moiré superlattice, misorientation

中图分类号:  (Microscopy of surfaces, interfaces, and thin films)

  • 68.37.-d
61.46.-w (Structure of nanoscale materials) 07.79.Cz (Scanning tunneling microscopes) 07.79.Lh (Atomic force microscopes)