中国物理B ›› 2009, Vol. 18 ›› Issue (1): 320-323.doi: 10.1088/1674-1056/18/1/052
闫军锋1, 张志勇1, 赵武2, 汪韬3, 王警卫3
Yan Jun-Feng(闫军锋)a)†, Wang Tao(汪韬)b), Wang Jing-Wei (王警卫)b), Zhang Zhi-Yong(张志勇)a), and Zhao Wu(赵武)a)b)
摘要: Low pressure metalorganic chemical vapour deposition (LP-MOCVD) growth and characteristics of InAsSb on (100) GaSb substrates are investigated. Mirror-like surfaces with a minimum lattice mismatch are obtained. The samples are studied by photoluminescence spectra, and the output is 3.17μm in wavelength. The surface of InAsSb epilayer shows that its morphological feature is dependent on buffer layer. With an InAs buffer layer used, the best surface is obtained. The InAsSb film shows to be of n-type conduction with an electron concentration of 8.52×1016cm-3.
中图分类号: (Nucleation and growth)