中国物理B ›› 2008, Vol. 17 ›› Issue (9): 3464-3470.doi: 10.1088/1674-1056/17/9/054

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The high deposition of microcrystalline silicon thin film by very high frequency plasma enhanced chemical vapour deposition and the fabrication of solar cells

汪建华1, 陈永生2, 卢景霄3, 郑文3, 谷锦华3, 杨仕娥3, 郜小勇3, 郭学军3, 赵尚丽3, 高 哲3   

  1. (1)Department of Materials Science and Engineering, Wuhan Institute of Technology, Wuhan 430073, China; (2)Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031, China;Key Laboratory of Material Physics, Department of Physics, Zhengzhou University, Zhengzhou 450052, China; (3)Key Laboratory of Material Physics, Department of Physics, Zhengzhou University, Zhengzhou 450052, China
  • 收稿日期:2007-12-24 修回日期:2008-01-07 出版日期:2008-09-08 发布日期:2008-09-08
  • 基金资助:
    Program supported by the State Key Development Program for Basic Research of China (Grant No 2006CB202601), and Basic Research Project of Henan Province in China (Grant No 072300410140).

The high deposition of microcrystalline silicon thin film by very high frequency plasma enhanced chemical vapour deposition and the fabrication of solar cells

Chen Yong-Sheng(陈永生)a)b), Wang Jian-Hua(汪建华)c), Lu Jing-Xiao(卢景霄)b), Zheng Wen(郑文)b), Gu Jin-Hua(谷锦华)b), Yang Shi-E(杨仕娥)b), Gao Xiao-Yong(郜小勇)b), Guo Xue-Jun(郭学军)b), Zhao Shang-Li(赵尚丽)b), and Gao Zhe(高哲)b)   

  1. a Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031, China; b Key Laboratory of Material Physics, Department of Physics, Zhengzhou University, Zhengzhou 450052, China; Department of Materials Science and Engineering, Wuhan Institute of Technology, Wuhan 430073, China
  • Received:2007-12-24 Revised:2008-01-07 Online:2008-09-08 Published:2008-09-08
  • Supported by:
    Program supported by the State Key Development Program for Basic Research of China (Grant No 2006CB202601), and Basic Research Project of Henan Province in China (Grant No 072300410140).

摘要: This paper reports that the intrinsic microcrystalline silicon ($\mu $c-Si:H) films are prepared with plasma enhanced chemical vapour deposition from silane/hydrogen mixtures at 200\du\ with the aim to increase the deposition rate. An increase of the deposition rate to 0.88\,nm/s is obtained by using a plasma excitation frequency of 75\,MHz. This increase is obtained by the combination of a higher deposition pressure, an increased silane concentration, and higher discharge powers. In addition, the transient behaviour, which can decrease the film crystallinity, could be prevented by filling the background gas with H$_{2}$ prior to plasma ignition, and selecting proper discharging time after silane flow injection. Material prepared under these conditions at a deposition rate of 0.78\,nm/s maintains higher crystallinity and fine electronic properties. By H-plasma treatment before i-layer deposition, single junction $\mu $c-Si:H solar cells with 5.5{\%} efficiency are fabricated.

关键词: chemical vapour deposition, plasma deposition, solar cells, crystallinity

Abstract: This paper reports that the intrinsic microcrystalline silicon ($\mu $c-Si:H) films are prepared with plasma enhanced chemical vapour deposition from silane/hydrogen mixtures at 200℃ with the aim to increase the deposition rate. An increase of the deposition rate to 0.88 nm/s is obtained by using a plasma excitation frequency of 75 MHz. This increase is obtained by the combination of a higher deposition pressure, an increased silane concentration, and higher discharge powers. In addition, the transient behaviour, which can decrease the film crystallinity, could be prevented by filling the background gas with H$_{2}$ prior to plasma ignition, and selecting proper discharging time after silane flow injection. Material prepared under these conditions at a deposition rate of 0.78 nm/s maintains higher crystallinity and fine electronic properties. By H-plasma treatment before i-layer deposition, single junction $\mu $c-Si:H solar cells with 5.5% efficiency are fabricated.

Key words: chemical vapour deposition, plasma deposition, solar cells, crystallinity

中图分类号:  (Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.))

  • 81.15.Gh
68.55.-a (Thin film structure and morphology) 68.55.A- (Nucleation and growth) 71.20.Mq (Elemental semiconductors) 73.50.Pz (Photoconduction and photovoltaic effects) 84.60.Jt (Photoelectric conversion)