中国物理B ›› 2026, Vol. 35 ›› Issue (3): 38101-038101.doi: 10.1088/1674-1056/ae2bf3
Yanhui Zhang(张燕辉)1,4,†,‡, Haitao Jiang(姜海涛)2,†, Liuyan Fan(范柳燕)1, Zifan Huo(霍子帆)1, Ziteng Zhang(张孜腾)1, Can Zhou(周灿)1, Yajie Wang(王亚杰)3, Changlin Zheng(郑长林)3, Haibo Shu(舒海波)5,§, Xiaohao Zhou(周孝好)1,4, Pingping Chen(陈平平)1,4,¶, Jin Zou(邹进)6,7, and Wei Lu(陆卫)1,4,8
Yanhui Zhang(张燕辉)1,4,†,‡, Haitao Jiang(姜海涛)2,†, Liuyan Fan(范柳燕)1, Zifan Huo(霍子帆)1, Ziteng Zhang(张孜腾)1, Can Zhou(周灿)1, Yajie Wang(王亚杰)3, Changlin Zheng(郑长林)3, Haibo Shu(舒海波)5,§, Xiaohao Zhou(周孝好)1,4, Pingping Chen(陈平平)1,4,¶, Jin Zou(邹进)6,7, and Wei Lu(陆卫)1,4,8
摘要: InAs nanowires (NWs) self-catalyzed grown on graphene surface frequently exhibit a large number of stacking-fault defects. However, the control of these defects in InAs NWs still remains a large challenge, which significantly limits the applications of InAs NWs in electronics and optoelectronics. In this work, the self-catalyzed growth of InAs NWs on graphene/Ge substrate by molecular beam epitaxy (MBE) is systematically investigated. Growth models for InAs NWs and parasitic islands on graphene/Ge are developed. Through rational design of growth parameters, the self-catalyzed growth of defect-free InAs NWs on graphene surfaces is ultimately achieved. Our experimental results indicate that lower growth temperature can effectively suppress the formation of stacking-fault defects in InAs NWs, no visible stacking-fault defects are observed in the samples grown below 510 ${^\circ}$C, and the intrinsic mechanism for this is clarified with the density functional theory (DFT) calculations.
中图分类号: (Molecular, atomic, ion, and chemical beam epitaxy)