[1] |
Guan Y H, Li Z C, Luo D X, Meng Q Z and Zhang Y F 2016 Chin. Phys. B 25 108502
doi: 10.1088/1674-1056/25/10/108502
|
[2] |
Dash S and Mishra G P 2015 Superlattices Microstruct. 86 211
doi: 10.1016/j.spmi.2015.07.049
|
[3] |
Vishnoi R and Kumar M J 2014 IEEE Trans. Electron. Dev. 61 2599
doi: 10.1109/TED.2014.2322762
|
[4] |
Dash S and Mishra G P 2015 Adv. Nat. Sci.: Nanosci. Nanotechnol. 6 035005
doi: 10.1088/2043-6262/6/3/035005
|
[5] |
Sharma A, Goud A A and Roy K 2014 IEEE Electron Dev. Lett. 35 1221
doi: 10.1109/LED.2014.2365413
|
[6] |
Ameen T A, Ilatikhameneh H, Fay P, Seabaugh A, Rahman R and Klimeck G 2019 IEEE Trans. Electron. Dev. 66 736
doi: 10.1109/TED.2018.2877753
|
[7] |
Toh E H, Wang G H, Chan L, Sylvester D, Heng C H, Ganesh S S and Yeo Y C 2008 Jpn. J. Appl. Phys. 47 2593
doi: 10.1143/JJAP.47.2593
|
[8] |
Han G Q, Wang Y B, Liu Y, Zhang C F, Feng Q, Liu M S, Zhao S L, Cheng B W, Zhang J C and Hao Y 2016 IEEE Electron Dev. Lett. 37 701
|
[9] |
Wang H J, Han G Q, Liu Y, Hu S D, Zhang C F, Zhang J C and Hao Y 2016 IEEE Trans. Electron Dev. 63 303
doi: 10.1109/TED.2015.2503385
|
[10] |
Liu M S, Liu Y, Wang H J, Zhang Q F, Zhang C F, Hu S D, Hao Y and Han G Q 2015 IEEE Trans. Electron Dev. 62 1262
|
[11] |
Kotlyar R, Avci U E, Cea S, Rios R, Linton T D, Kuhn K J and Young I A 2013 Appl. Phys. Lett. 102 113106
doi: 10.1063/1.4798283
|
[12] |
Boucart K and Ionescu A M 2007 IEEE Trans. Electron Dev. 54 1725
doi: 10.1109/TED.2007.899389
|
[13] |
Wu Y, Hasegawa H, Kakushima K, Ohmori K, Watanabe T, Nishiyama A, Sugii N, Wakabayashi H, Tsutsui K, Kataoka Y, Natori K, Yamada K and Iwai H 2014 Microeletron. Reliab. 54 899
doi: 10.1016/j.microrel.2014.01.023
|
[14] |
Rahi S B, Ghosh B and Asthana P 2014 J. Semicond. 35 114005
doi: 10.1088/1674-4926/35/11/114005
|
[15] |
Duan X, Zhang J, Wang S, Li Y, Xu S and Hao Y 2018 IEEE Trans. Electron Dev. 65 1223
doi: 10.1109/TED.2018.2796848
|
[16] |
Ghosh S, Koley K, Saha S K, and Sarkar C K 2016 IEEE Trans. Electron Dev. 63 3869
doi: 10.1109/TED.2016.2601884
|
[17] |
Zhao Y, Wu C L, Huang Q Q, Chen C, Zhu J D, Guo L Y, Jia R D, Lv Z, Yang Y C, Li M and Huang R 2017 IEEE Electron Dev. Lett. 38 540
doi: 10.1109/LED.2017.2679031
|
[18] |
Cui N, Liang R R and Xu J 2011 Appl. Phys. Lett. 98 142105
doi: 10.1063/1.3574363
|
[19] |
Zhang S Q, Liang R R, Wang J, Tan Z and Xu J 2017 Chin. Phys. B 26 018504
doi: 10.1088/1674-1056/26/1/018504
|
[20] |
Xu H F, Dai Y H, Guan B G and Zhang Y F 2016 Jpn. J. Appl. Phys. 55 094001
doi: 10.7567/JJAP.55.094001
|
[21] |
Raad B R, Sharma D, Kondekar P, Nigam K and Yadav D S 2016 IEEE Trans. Electron Dev. 63 3950
doi: 10.1109/TED.2016.2600621
|
[22] |
Tirkey S, Sharma D, Raad B R and Yadav D S 2018 IEEE Trans. Electron Dev. 65 282
doi: 10.1109/TED.2017.2766262
|
[23] |
Nigam K, Pandey S, Kondekar P N, Sharma D and Parte P K 2017 IEEE Trans. Electron Dev. 64 2751
doi: 10.1109/TED.2017.2693679
|
[24] |
Wu J Z and Taur Y 2016 IEEE Trans. Electron Dev. 63 3342
doi: 10.1109/TED.2016.2577589
|
[25] |
Xu P, Lou H, Zhang L, Yu Z and Lin X 2017 IEEE Trans. Electron Dev. 64 5242
doi: 10.1109/TED.2017.2762861
|
[26] |
Kumar P and Bhowmick B 2018 Micro & Nano Lett. 13 626
|
[27] |
Lu B, Lu H, Zhang Y, Zhang Y, Cui X, Lv Z and Liu C 2018 IEEE Trans. Electron Dev. 65 3555
doi: 10.1109/TED.2018.2849742
|
[28] |
Kang I M, Jang J S and Choi W Y 2011 Jpn. J. Appl. Phys. 50 124301
|
[29] |
Yadav D S, Sharma D, Tirkey S, Bajaj V 2018 J. Comput. Electron 17 118
doi: 10.1007/s10825-017-1045-0
|
[30] |
Shaker A, ElSabbagh M and El-Banna M M 2019 Physica E: Low-dimensional Systems and Nanostructures 106 346
doi: 10.1016/j.physe.2018.07.001
|
[31] |
Dash D K, Saha P and Sarkar S K 2018 J. Comput. Electron. 17 181
doi: 10.1007/s10825-017-1102-8
|
[32] |
ATLAS User's Manual (Silvaco Int., Santa Clara, C A 2012)
|
[33] |
Kane E O 1960 J. Phys. Chem. Solids 12 181
doi: 10.1016/0022-3697(60)90035-4
|
[34] |
Kumar S, Goel E, Singh K, Singh B, Singh P K, Baral K and Jit S 2017 IEEE Trans. Electron Dev. 64 960
doi: 10.1109/TED.2017.2656630
|
[35] |
Wu C L, Huang Q Q, Zhao Y, Wang J X, Wang Y Y and Huang R 2016 IEEE Trans. Electron Dev. 63 5072
doi: 10.1109/TED.2016.2619694
|