中国物理B ›› 2024, Vol. 33 ›› Issue (8): 86803-086803.doi: 10.1088/1674-1056/ad51f4

所属专题: SPECIAL TOPIC — Stephen J. Pennycook: A research life in atomic-resolution STEM and EELS

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Symmetry quantification and segmentation in STEM imaging through Zernike moments

Jiadong Dan1,2,†, Cheng Zhang3, Xiaoxu Zhao(赵晓续)4, and N. Duane Loh1,2,3,‡   

  1. 1 Department of Biological Sciences, National University of Singapore, Singapore;
    2 Center for Bioimaging Sciences (CBIS), National University of Singapore, Singapore;
    3 Department of Physics, National University of Singapore, Singapore;
    4 School of Materials Science and Engineering, Peking University, Beijing 100871, China
  • 收稿日期:2024-03-30 修回日期:2024-05-24 出版日期:2024-08-15 发布日期:2024-07-15
  • 通讯作者: Jiadong Dan, N. Duane Loh E-mail:jiadong.dan@u.nus.edu;duaneloh@nus.edu.sg
  • 基金资助:
    N.D.L. acknowledges funding support from the National Research Foundation (Competitive Research Program grant number NRF-CRP16-2015-05) and the National University of Singapore Early Career Research Award.

Symmetry quantification and segmentation in STEM imaging through Zernike moments

Jiadong Dan1,2,†, Cheng Zhang3, Xiaoxu Zhao(赵晓续)4, and N. Duane Loh1,2,3,‡   

  1. 1 Department of Biological Sciences, National University of Singapore, Singapore;
    2 Center for Bioimaging Sciences (CBIS), National University of Singapore, Singapore;
    3 Department of Physics, National University of Singapore, Singapore;
    4 School of Materials Science and Engineering, Peking University, Beijing 100871, China
  • Received:2024-03-30 Revised:2024-05-24 Online:2024-08-15 Published:2024-07-15
  • Contact: Jiadong Dan, N. Duane Loh E-mail:jiadong.dan@u.nus.edu;duaneloh@nus.edu.sg
  • Supported by:
    N.D.L. acknowledges funding support from the National Research Foundation (Competitive Research Program grant number NRF-CRP16-2015-05) and the National University of Singapore Early Career Research Award.

摘要: We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects. We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS$_2$, enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects. This approach enhances the analysis of structural variations in crystalline materials, marking a notable advancement in the characterization of structures in materials science.

关键词: scanning transmission electron microscopy (STEM), symmetry, segmentation

Abstract: We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects. We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS$_2$, enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects. This approach enhances the analysis of structural variations in crystalline materials, marking a notable advancement in the characterization of structures in materials science.

Key words: scanning transmission electron microscopy (STEM), symmetry, segmentation

中图分类号:  (Scanning transmission electron microscopy (STEM))

  • 68.37.Ma
61.50.Ah (Theory of crystal structure, crystal symmetry; calculations and modeling) 07.05.Pj (Image processing) 81.07.-b (Nanoscale materials and structures: fabrication and characterization)