中国物理B ›› 2021, Vol. 30 ›› Issue (8): 87301-087301.doi: 10.1088/1674-1056/abe3e4

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Accurate capacitance-voltage characterization of organic thin films with current injection

Ming Chu(褚明)1, Shao-Bo Liu(刘少博)1, An-Ran Yu(蔚安然)2,†, Hao-Miao Yu(于浩淼)3, Jia-Jun Qin(秦佳俊)4, Rui-Chen Yi(衣睿宸)1, Yuan Pei(裴远)1, Chun-Qin Zhu(朱春琴)1, Guang-Rui Zhu(朱光瑞)1, Qi Zeng(曾琪)5, and Xiao-Yuan Hou(侯晓远)1,‡   

  1. 1 State Key Laboratory of Surface Physics, Fudan University, Shanghai 200433, China;
    2 State Key Laboratory of ASIC and System, Center of Micro-Nano System, SIST, Fudan University, Shanghai 200433, China;
    3 Key Laboratory of Luminescence and Optical Information, Ministry of Education, School of Science, Beijing Jiaotong University, Beijing 100044, China;
    4 Department of Physics, Chemistry and Biology(IFM), Linköping University, Linköping SE-581 83, Sweden;
    5 School of Material Engineering, Shanghai University of Engineering Science, Shanghai 201620, China
  • 收稿日期:2020-12-23 修回日期:2021-01-27 接受日期:2021-02-07 出版日期:2021-07-16 发布日期:2021-08-02
  • 通讯作者: An-Ran Yu, Xiao-Yuan Hou E-mail:12110190029@fudan.edu.cn;xyhou@fudan.edu.cn
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 11874007 and 12074076).

Accurate capacitance-voltage characterization of organic thin films with current injection

Ming Chu(褚明)1, Shao-Bo Liu(刘少博)1, An-Ran Yu(蔚安然)2,†, Hao-Miao Yu(于浩淼)3, Jia-Jun Qin(秦佳俊)4, Rui-Chen Yi(衣睿宸)1, Yuan Pei(裴远)1, Chun-Qin Zhu(朱春琴)1, Guang-Rui Zhu(朱光瑞)1, Qi Zeng(曾琪)5, and Xiao-Yuan Hou(侯晓远)1,‡   

  1. 1 State Key Laboratory of Surface Physics, Fudan University, Shanghai 200433, China;
    2 State Key Laboratory of ASIC and System, Center of Micro-Nano System, SIST, Fudan University, Shanghai 200433, China;
    3 Key Laboratory of Luminescence and Optical Information, Ministry of Education, School of Science, Beijing Jiaotong University, Beijing 100044, China;
    4 Department of Physics, Chemistry and Biology(IFM), Linköping University, Linköping SE-581 83, Sweden;
    5 School of Material Engineering, Shanghai University of Engineering Science, Shanghai 201620, China
  • Received:2020-12-23 Revised:2021-01-27 Accepted:2021-02-07 Online:2021-07-16 Published:2021-08-02
  • Contact: An-Ran Yu, Xiao-Yuan Hou E-mail:12110190029@fudan.edu.cn;xyhou@fudan.edu.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 11874007 and 12074076).

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摘要： To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage (C-V) characterization of organic thin films when current injection is significant, a three-element equivalent circuit model is proposed. On this basis, the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method. The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor, a diode, and a resistor. Moreover, the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result, and the real capacitance is 35.7% higher than the directly measured capacitance at 5-V bias in the parallel mode. This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.

关键词: current injection, organic thin film, capacitance-voltage, parasitic resistance

Abstract: To deal with the invalidation of commonly employed series model and parallel model in capacitance-voltage (C-V) characterization of organic thin films when current injection is significant, a three-element equivalent circuit model is proposed. On this basis, the expression of real capacitance in consideration of current injection is theoretically derived by small-signal analysis method. The validity of the proposed equivalent circuit and theoretical expression are verified by a simulating circuit consisting of a capacitor, a diode, and a resistor. Moreover, the accurate C-V characteristic of an organic thin film device is obtained via theoretical correction of the experimental measuring result, and the real capacitance is 35.7% higher than the directly measured capacitance at 5-V bias in the parallel mode. This work strongly demonstrates the necessity to consider current injection in C-V measurement and provides a strategy for accurate C-V characterization experimentally.

Key words: current injection, organic thin film, capacitance-voltage, parasitic resistance

中图分类号:  (Persistent currents)

  • 73.23.Ra
73.61.Le (Other inorganic semiconductors) 84.37.+q (Measurements in electric variables (including voltage, current, resistance, capacitance, inductance, impedance, and admittance, etc.)) 73.40.Cg (Contact resistance, contact potential)