中国物理B ›› 2015, Vol. 24 ›› Issue (6): 68703-068703.doi: 10.1088/1674-1056/24/6/068703

• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇    下一篇

Experimental research on the feature of an x-ray Talbot-Lau interferometer versus tube accelerating voltage

王圣浩a, Margie P. Olbinadob, Atsushi Momoseb, 韩华杰a, 胡仁芳a, 王志立a, 高昆a, 张凯c, 朱佩平c, 吴自玉a c   

  1. a National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230027, China;
    b Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan;
    c Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • 收稿日期:2014-11-04 修回日期:2015-01-04 出版日期:2015-06-05 发布日期:2015-06-05
  • 基金资助:

    Project supported by the Major State Basic Research Development Program of China (Grant No. 2012CB825800), the Science Fund for Creative Research Groups, China (Grant No. 11321503), the National Natural Science Foundation of China (Grant Nos. 11179004, 10979055, 11205189, and 11205157), and the Japan-Asia Youth Exchange Program in Science (SAKURA Exchange Program in Science) Administered by the Japan Science and Technology Agency.

Experimental research on the feature of an x-ray Talbot-Lau interferometer versus tube accelerating voltage

Wang Sheng-Hao (王圣浩)a, Margie P. Olbinadob, Atsushi Momoseb, Han Hua-Jie (韩华杰)a, Hu Ren-Fang (胡仁芳)a, Wang Zhi-Li (王志立)a, Gao Kun (高昆)a, Zhang Kai (张凯)c, Zhu Pei-Ping (朱佩平)c, Wu Zi-Yu (吴自玉)a c   

  1. a National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230027, China;
    b Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan;
    c Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • Received:2014-11-04 Revised:2015-01-04 Online:2015-06-05 Published:2015-06-05
  • Contact: Wang Sheng-Hao, Wu Zi-Yu E-mail:wongshenghao@gmail.com;wuzy@ustc.edu.cn
  • About author:87.59.-e; 07.60.Ly; 42.30.Rx; 87.57.-s
  • Supported by:

    Project supported by the Major State Basic Research Development Program of China (Grant No. 2012CB825800), the Science Fund for Creative Research Groups, China (Grant No. 11321503), the National Natural Science Foundation of China (Grant Nos. 11179004, 10979055, 11205189, and 11205157), and the Japan-Asia Youth Exchange Program in Science (SAKURA Exchange Program in Science) Administered by the Japan Science and Technology Agency.

摘要:

X-ray Talbot–Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a conventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus bearing tremendous potential for future clinical diagnosis. In this work, by changing the accelerating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot–Lau interferometer (located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan) versus tube voltage. Experimental results and data analysis show that within a range this x-ray Talbot–Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of ~ 44%. This x-ray Talbot–Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.

关键词: x-ray Talbot-Lau interferometer, x-ray imaging, phase-contrast, tube accelerating voltage, x-ray tube

Abstract:

X-ray Talbot–Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a conventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus bearing tremendous potential for future clinical diagnosis. In this work, by changing the accelerating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot–Lau interferometer (located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan) versus tube voltage. Experimental results and data analysis show that within a range this x-ray Talbot–Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of ~ 44%. This x-ray Talbot–Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.

Key words: x-ray Talbot-Lau interferometer, x-ray imaging, phase-contrast, tube accelerating voltage, x-ray tube

中图分类号:  (X-ray imaging)

  • 87.59.-e
07.60.Ly (Interferometers) 42.30.Rx (Phase retrieval) 87.57.-s (Medical imaging)