中国物理B ›› 2015, Vol. 24 ›› Issue (6): 68703-068703.doi: 10.1088/1674-1056/24/6/068703
• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇 下一篇
王圣浩a, Margie P. Olbinadob, Atsushi Momoseb, 韩华杰a, 胡仁芳a, 王志立a, 高昆a, 张凯c, 朱佩平c, 吴自玉a c
Wang Sheng-Hao (王圣浩)a, Margie P. Olbinadob, Atsushi Momoseb, Han Hua-Jie (韩华杰)a, Hu Ren-Fang (胡仁芳)a, Wang Zhi-Li (王志立)a, Gao Kun (高昆)a, Zhang Kai (张凯)c, Zhu Pei-Ping (朱佩平)c, Wu Zi-Yu (吴自玉)a c
摘要:
X-ray Talbot–Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a conventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus bearing tremendous potential for future clinical diagnosis. In this work, by changing the accelerating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot–Lau interferometer (located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan) versus tube voltage. Experimental results and data analysis show that within a range this x-ray Talbot–Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of ~ 44%. This x-ray Talbot–Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.
中图分类号: (X-ray imaging)