中国物理B ›› 2016, Vol. 25 ›› Issue (10): 108702-108702.doi: 10.1088/1674-1056/25/10/108702

• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇    下一篇

Elemental x-ray imaging using Zernike phase contrast

Qi-Gang Shao(邵其刚), Jian Chen(陈健), Faiz Wali, Yuan Bao(鲍园), Zhi-Li Wang(王志立), Pei-Ping Zhu(朱佩平), Yang-Chao Tian(田扬超), Kun Gao(高昆)   

  1. 1 National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China;
    2 School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230009, China;
    3 Institute of High Energy Physics, Chinese Academy of Science, Beijing 100049, China
  • 收稿日期:2016-04-13 修回日期:2016-05-17 出版日期:2016-10-05 发布日期:2016-10-05
  • 通讯作者: Pei-Ping Zhu, Yang-Chao Tian, Kun Gao E-mail:zhupp@ihep.ac.cn;ychtian@ustc.edu.cn;gaokun@ustc.edu.cn
  • 基金资助:
    Project supported by the National Basic Research Program of China (Grant No. 2012CB825801) and the National Natural Science Foundation of China (Grant Nos. 11505188, and 11305173).

Elemental x-ray imaging using Zernike phase contrast

Qi-Gang Shao(邵其刚)1, Jian Chen(陈健)1, Faiz Wali1, Yuan Bao(鲍园)1, Zhi-Li Wang(王志立)2, Pei-Ping Zhu(朱佩平)3, Yang-Chao Tian(田扬超)1, Kun Gao(高昆)1   

  1. 1 National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China;
    2 School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230009, China;
    3 Institute of High Energy Physics, Chinese Academy of Science, Beijing 100049, China
  • Received:2016-04-13 Revised:2016-05-17 Online:2016-10-05 Published:2016-10-05
  • Contact: Pei-Ping Zhu, Yang-Chao Tian, Kun Gao E-mail:zhupp@ihep.ac.cn;ychtian@ustc.edu.cn;gaokun@ustc.edu.cn
  • Supported by:
    Project supported by the National Basic Research Program of China (Grant No. 2012CB825801) and the National Natural Science Foundation of China (Grant Nos. 11505188, and 11305173).

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摘要： We develop an element-specific x-ray microscopy method by using Zernike phase contrast imaging near absorption edges, where a real part of refractive index changes abruptly. In this method two phase contrast images are subtracted to obtain the target element: one is at the absorption edge of the target element and the other is near the absorption edge. The x-ray exposure required by this method is expected to be significantly lower than that of conventional absorption-based x-ray elemental imaging methods. Numerical calculations confirm the advantages of this highly efficient imaging method.

关键词: x-ray imaging, Zernike phase contrast, elemental imaging

Abstract: We develop an element-specific x-ray microscopy method by using Zernike phase contrast imaging near absorption edges, where a real part of refractive index changes abruptly. In this method two phase contrast images are subtracted to obtain the target element: one is at the absorption edge of the target element and the other is near the absorption edge. The x-ray exposure required by this method is expected to be significantly lower than that of conventional absorption-based x-ray elemental imaging methods. Numerical calculations confirm the advantages of this highly efficient imaging method.

Key words: x-ray imaging, Zernike phase contrast, elemental imaging

中图分类号:  (X-ray imaging)

  • 87.59.-e
68.37.Yz (X-ray microscopy) 87.64.mh (Phase contrast and DIC)