Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging

doi:10.1088/1674-1056/ac685d

中国物理B ›› 2023, Vol. 32 ›› Issue (2): 28701-028701.doi: 10.1088/1674-1056/ac685d

Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging

Li-Ming Zhao(赵立明)¹, Tian-Xiang Wang(王天祥)¹, Run-Kang Ma(马润康)¹, Yao Gu(顾瑶)¹, Meng-Si Luo(罗梦丝)¹, Heng Chen(陈恒)¹, Zhi-Li Wang(王志立)^1,†, and Xin Ge(葛昕)²

1 Department of Optical Engineering, School of Physics, Hefei University of Technology, Anhui 230009, China;
2 Institute of Biomedical Engineering, Shenzhen Bay Laboratory, Shenzhen 518067, China

收稿日期:2022-01-21 修回日期:2022-04-06 接受日期:2022-04-20 出版日期:2023-01-10 发布日期:2023-01-18
通讯作者: Zhi-Li Wang E-mail:dywangzl@hfut.edu.cn
基金资助:
Project supported by the National Natural Science Foundation of China (Grant Nos. U1532113, 11475170, and 11905041), the Fundamental Research Funds for the Central Universities (Grant No. PA2020GDKC0024), and Anhui Provincial Natural Science Foundation, China (Grant No. 2208085MA18).

Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging

Li-Ming Zhao(赵立明)¹, Tian-Xiang Wang(王天祥)¹, Run-Kang Ma(马润康)¹, Yao Gu(顾瑶)¹, Meng-Si Luo(罗梦丝)¹, Heng Chen(陈恒)¹, Zhi-Li Wang(王志立)^1,†, and Xin Ge(葛昕)²

1 Department of Optical Engineering, School of Physics, Hefei University of Technology, Anhui 230009, China;
2 Institute of Biomedical Engineering, Shenzhen Bay Laboratory, Shenzhen 518067, China

Received:2022-01-21 Revised:2022-04-06 Accepted:2022-04-20 Online:2023-01-10 Published:2023-01-18
Contact: Zhi-Li Wang E-mail:dywangzl@hfut.edu.cn
Supported by:
Project supported by the National Natural Science Foundation of China (Grant Nos. U1532113, 11475170, and 11905041), the Fundamental Research Funds for the Central Universities (Grant No. PA2020GDKC0024), and Anhui Provincial Natural Science Foundation, China (Grant No. 2208085MA18).

摘要/Abstract

摘要： X-ray analyzer-based imaging (ABI) is a powerful phase-sensitive technique that can provide a wide dynamic range of density and extract useful physical properties of the sample. It derives contrast from x-ray absorption, refraction, and scattering properties of the investigated sample. However, x-ray ABI setups can be susceptible to external vibrations, and mechanical imprecisions of system components, e.g., the precision of motor, which are unavoidable in practical experiments. Those factors will provoke deviations of analyzer angular positions and hence errors in the acquired image data. Consequently, those errors will introduce artefacts in the retrieved refraction and scattering images. These artefacts are disadvantageous for further image interpretation and tomographic reconstruction. For this purpose, this work aims to analyze image artefacts resulting from deviations of analyzer angular positions. Analytical expressions of the refraction and scattering image artefacts are derived theoretically and validated by synchrotron radiation experiments. The results show that for the refraction image, the artefact is independent of the sample's absorption and scattering signals. By contrast, artefact of the scattering image is dependent on both the sample's refraction and scattering signals, but not on absorption signal. Furthermore, the effect of deviations of analyzer angular positions on the accuracy of the retrieved images is investigated, which can be of use for optimization of data acquisition. This work offers the possibility to develop advanced multi-contrast image retrieval algorithms that suppress artefacts in the retrieved refraction and scattering images in x-ray analyzer-based imaging.

关键词: x-ray imaging, analyzer-based imaging, image artefacts

Abstract: X-ray analyzer-based imaging (ABI) is a powerful phase-sensitive technique that can provide a wide dynamic range of density and extract useful physical properties of the sample. It derives contrast from x-ray absorption, refraction, and scattering properties of the investigated sample. However, x-ray ABI setups can be susceptible to external vibrations, and mechanical imprecisions of system components, e.g., the precision of motor, which are unavoidable in practical experiments. Those factors will provoke deviations of analyzer angular positions and hence errors in the acquired image data. Consequently, those errors will introduce artefacts in the retrieved refraction and scattering images. These artefacts are disadvantageous for further image interpretation and tomographic reconstruction. For this purpose, this work aims to analyze image artefacts resulting from deviations of analyzer angular positions. Analytical expressions of the refraction and scattering image artefacts are derived theoretically and validated by synchrotron radiation experiments. The results show that for the refraction image, the artefact is independent of the sample's absorption and scattering signals. By contrast, artefact of the scattering image is dependent on both the sample's refraction and scattering signals, but not on absorption signal. Furthermore, the effect of deviations of analyzer angular positions on the accuracy of the retrieved images is investigated, which can be of use for optimization of data acquisition. This work offers the possibility to develop advanced multi-contrast image retrieval algorithms that suppress artefacts in the retrieved refraction and scattering images in x-ray analyzer-based imaging.

Key words: x-ray imaging, analyzer-based imaging, image artefacts

中图分类号: (X-ray imaging)

87.59.-e

42.30.Va (Image forming and processing) 87.57.N- (Image analysis)

Li-Ming Zhao(赵立明), Tian-Xiang Wang(王天祥), Run-Kang Ma(马润康), Yao Gu(顾瑶), Meng-Si Luo(罗梦丝), Heng Chen(陈恒), Zhi-Li Wang(王志立), and Xin Ge(葛昕). Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging[J]. 中国物理B, 2023, 32(2): 28701-028701.

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Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging

Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging

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