Investigation of Zn1-xCdxO films bandgap and Zn1-xCdxO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy

doi:10.1088/1674-1056/26/8/087309

中国物理B ›› 2017, Vol. 26 ›› Issue (8): 87309-087309.doi: 10.1088/1674-1056/26/8/087309

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇下一篇

Investigation of Zn_1-xCd_xO films bandgap and Zn_1-xCd_xO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy

Jie Chen(陈杰), Xue-Min Wang(王雪敏), Ji-Cheng Zhang(张继成), Hong-Bu Yin(尹泓卜), Jian Yu(俞健), Yan Zhao(赵妍), Wei-Dong Wu(吴卫东)

Science and Technology on Plasma Physics Laboratory, Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China

收稿日期:2017-03-01 修回日期:2017-04-19 出版日期:2017-08-05 发布日期:2017-08-05
通讯作者: Yan Zhao, Wei-Dong Wu E-mail:zhaoyan267@163.com;wuweidongding@163.com
基金资助:
Project supported by the National Natural Science Foundation of China (Grant No. 11404302) and the Laser Fusion Research Center Funds for Young Talents (Grant No. RCFPD1-2017-9).

Investigation of Zn_1-xCd_xO films bandgap and Zn_1-xCd_xO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy

Jie Chen(陈杰), Xue-Min Wang(王雪敏), Ji-Cheng Zhang(张继成), Hong-Bu Yin(尹泓卜), Jian Yu(俞健), Yan Zhao(赵妍), Wei-Dong Wu(吴卫东)

Science and Technology on Plasma Physics Laboratory, Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China

Received:2017-03-01 Revised:2017-04-19 Online:2017-08-05 Published:2017-08-05
Contact: Yan Zhao, Wei-Dong Wu E-mail:zhaoyan267@163.com;wuweidongding@163.com
About author:0.1088/1674-1056/26/8/
Supported by:
Project supported by the National Natural Science Foundation of China (Grant No. 11404302) and the Laser Fusion Research Center Funds for Young Talents (Grant No. RCFPD1-2017-9).

摘要/Abstract

摘要：

A series of Zn_1-xCd_xO thin films have been fabricated on sapphire by pulsed-laser deposition (PLD), successfully. To investigate the effect of Cd concentration on structural and optical properties of Zn_1-xCd_xO films, x-ray diffraction (XRD), ultraviolet-visible spectroscopy (UV-vis), and x-ray photoelectron spectroscopy (XPS) are employed to characterize the films in detail. The XRD pattern indicates that the Zn_1-xCd_xO thin films have high single-orientation of the c axis. The energy bandgap values of ZnCdO thin films decrease from 3.26 eV to 2.98 eV with the increasing Cd concentration (x) according to the (αhν)²-hν curve. Furthermore, the band offsets of Zn_1-xCd_xO/ZnO heterojunctions are determinated by XPS, indicating that a type-I alignment takes place at the interface and the value of band offset could be tuned by adjusting the Cd concentration.

关键词: ZnCdO film, ZnCdO/ZnO heterojunction, optical bandgap, band offset

Abstract:

Key words: ZnCdO film, ZnCdO/ZnO heterojunction, optical bandgap, band offset

中图分类号: (II-VI semiconductors)

73.61.Ga

78.20.Ci (Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)) 68.60.-p (Physical properties of thin films, nonelectronic)

陈杰, 王雪敏, 张继成, 尹泓卜, 俞健, 赵妍, 吴卫东. Investigation of Zn_1-xCd_xO films bandgap and Zn_1-xCd_xO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy[J]. 中国物理B, 2017, 26(8): 87309-087309.

Jie Chen(陈杰), Xue-Min Wang(王雪敏), Ji-Cheng Zhang(张继成), Hong-Bu Yin(尹泓卜), Jian Yu(俞健), Yan Zhao(赵妍), Wei-Dong Wu(吴卫东). Investigation of Zn_1-xCd_xO films bandgap and Zn_1-xCd_xO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy[J]. Chin. Phys. B, 2017, 26(8): 87309-087309.

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Investigation of Zn_1-xCd_xO films bandgap and Zn_1-xCd_xO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy

Investigation of Zn_1-xCd_xO films bandgap and Zn_1-xCd_xO/ZnO heterojunctions band offset by x-ray photoelectron spectroscopy

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